Method for optimizing route for exposing wafer
A path optimization and path technology, applied in the field of photolithography, can solve the problems of long exposure time, consumption, affecting the system exposure yield, etc., and achieve the effect of shortening the consumption time and improving the yield.
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[0025] The following first summarizes the method for optimizing the wafer exposure path of the present invention.
[0026] First, it is necessary to determine the exposure field distribution and the exposure path restriction conditions. The exposure field distribution is determined according to the process parameters of the product with the assistance of the lithography machine process software. The exposure field distribution information mainly includes the center coordinates of each exposure field and the state to be exposed. The purpose of collecting the exposure field distribution information is to Further determine the exposure path restriction conditions, and provide reference data for subsequent scanning, exposure and other steps. Exposure path restriction conditions are used to determine the legitimacy of an exposure path, which mainly depends on the measurability of the leveling parameters of the exposure field. Refer to Figure 2, which shows the exposure field distributi...
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