Optical angle gauge test calibrator utilizing mutual orthogonal double-frequency laser interferometer
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- BEIJING INSTITUTE OF TECHNOLOGYGY
- Publication Date
- 2007-11-07
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention belongs to the field of small-angle measurement and measurement, and relates to a method and a device for realizing high-precision measurement and calibration of the deflection angle generated by monochromatic light passing through an optical angle gauge. The calibrated optical angle gauge can be used as a standard small-angle generator or a small-angle reference to complete the test and calibration of the indication error of the autocollimator micrometer, theodolite subdivision reading system, and goniometric instruments. Background technique
[0002] Small-angle metrology is an important part of metrology science. With the upgrading and industrialization of photoelectric digital image testing instruments, the demand for small-angle measurement is increasing, and the requirements for its accuracy are also getting higher and higher. In the aerospace measurement and control system, a high-precision small-angle generator is required to pro...