Method and apparatus for inspecting and controlling X-ray probe

A technology of detection control and control method, applied in the direction of using radiation for material analysis, special data processing applications, instruments, etc., can solve the problems of wasting materials, unable to know the radiation dose rate and cumulative dose, time-consuming and labor-intensive, etc., to reduce the workload , the effect of reducing the loss of film material

Inactive Publication Date: 2007-11-21
DANDONG HUARI SCIENCE ELECTRIC CO LTD
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  • Abstract
  • Description
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Problems solved by technology

[0002] When performing real-time imaging detection on workpieces, since the existing X-ray flaw detectors do not have radiation dose detection and control, users cannot know the radiation dose rate and cumulative dose when using X-ray flaw detectors to detect workpieces. The radiation dose of the X-ray flaw detector can be estimated by observing the exposure parameters (such as kV, mA, and exposure time, etc.). Whenever the material, thickness, and filming focal length of the workpiece change, the exposure parameters and To obtain the required radiation dose, it is time-consuming and labor-intensive, as well as a waste of materials

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  • Method and apparatus for inspecting and controlling X-ray probe
  • Method and apparatus for inspecting and controlling X-ray probe
  • Method and apparatus for inspecting and controlling X-ray probe

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Embodiment 1

[0023] Embodiment 1 A connection structure between a portable X-ray flaw detector and a detection control device is illustrated in conjunction with accompanying drawing 3: the principle of radiation dose detection and control is shown in Figure 1, the circuit of the X-ray detection device is shown in Figure 2, and the X-ray detector adopts the product model GL1221, the signal of the X-ray detector is connected to the conversion circuit, and they are installed together to form a single component, that is, the X-ray dose detection device 2, and the X-ray dose detection device 2 is connected to the X-ray flaw detector with the dose transmission cable 4 and the connection cable 5 The A / D circuit in the controller 3 is composed of commodity LM331 and peripheral components. The A / D circuit is connected to the commodity 89C51 microprocessor in the controller 3 of the X-ray flaw detector. Generator 1, the power supply cable 6 of X-ray flaw detector controller 3 is connected to the powe...

Embodiment 2

[0039] Embodiment 2 The connection structure between a mobile X-ray flaw detector and the detection control device is shown in Figure 4. The X-ray detector adopts the product model GL1221, and the signal of the X-ray detector is connected to the conversion circuit. They are installed together to form a single The components of X-ray dose detection device 5 are X-ray dose detection device 5, which is connected to the A / D circuit composed of commodity LM331 and peripheral components in the controller 4 of X-ray flaw detector with dose transmission cable 8, and the A / D circuit is connected to X-ray The product model 89C51 microprocessor in the controller 4 of the flaw detection machine, the signal output end of the microprocessor is connected to the display unit mounted on the control panel, and the signal output of the microprocessor controls the parameters of the X-ray flaw detector. The X-ray flaw detector controller 4 signal output end is connected to the anode high-voltage ge...

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Abstract

A method for controlling X-ray crack detector includes adding X-ray dosage detection-control unit on existing X-ray crack detector to let said detector have detection-control function of radiation dosage for displaying dosage rate and accumulation dosage of radiation in real time, enabling to convert accumulation dosage to be blackness value of film for controlling exposure parameters so as to have optimum imaging-result.

Description

technical field [0001] The invention relates to a radiation dose control method and a detection control device of an X-ray flaw detector. Background technique [0002] When performing real-time imaging detection on workpieces, since the existing X-ray flaw detectors do not have radiation dose detection and control, users cannot know the radiation dose rate and cumulative dose when using X-ray flaw detectors to detect workpieces. The radiation dose of the X-ray flaw detector can be estimated by observing the exposure parameters (such as kV, mA, and exposure time, etc.). Whenever the material, thickness, and filming focal length of the workpiece change, the exposure parameters and The required radiation dose can only be obtained by filming, which is time-consuming and labor-intensive, as well as a waste of materials. Contents of the invention [0003] According to the defects existing in the existing X-ray flaw detector, the invention proposes a control method for the X-ray...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/18G06F19/00
Inventor 吕相钦夏海涛夏春凯肖丹鹏
Owner DANDONG HUARI SCIENCE ELECTRIC CO LTD
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