Configuring and testing method and system in ATCA system

Abstract

The invention discloses a configuration and testing system in a high-performance communication computing architecture system, comprising: a JTAG bridge, located on a single board to be tested, and used to gate the JTAG connected to the JTAG bridge under the control of a test control unit Device, JTAG chain, JTAG bridge and/or JTAG drive; test control unit, used to obtain test vectors for testing or configuration, and control the JTAG bridge to select the JTAG device and JTAG chain connected to the JTAG bridge , JTAG bridge chip and/or JTAG driver, so as to connect to the specified JTAG device and/or JTAG chain, and send the test vector to the specified JTAG device and/or JTAG chain for testing or configuration. Thereby, the test and configuration speed in ATCA are improved and the management board test and configuration can be performed.

Description

technical field [0001] The invention relates to the field of ATCA (Advanced Telecommunication Computing Architecture high-performance communication computing architecture), in particular to a configuration and testing method and system in the ATCA system. Background technique [0002] As demand for wireless and wireline services continues to grow, the telecommunications industry recognizes the need to move beyond proprietary or partially open architectures in order to gain more options. Therefore, PICMG (PCI Industrial Computer Manufacturers Group PCI Industrial Computer Manufacturing Organization) proposed the relevant specifications of ATCA's open hardware platform, called PICMG 3.X specification, which provides sufficient scalability and space for the new generation of network elements and supports multiple switching Protocols and interfaces provide a set of chassis-level management mechanisms, adopt industry-standard IPMI (Intelligent Platform Management Interface), and ...

AI Technical Summary

Problems solved by technology

This is the first unfavorable factor for the application of JTAG technology in ATCA

[0009] In addition, the communication method shown in Figure 4 requires the local controller on the single board, BMC (Baseboard Management Controller) or IPMC, to be in working state, if the local controller is not in working state, for example, in the factory production Under test conditions or the local controller is in a fault state for some reason, the JTAG test process will not be possible

This is the second unfavorable factor for the application of JTAG technology in ATCA

[0010] In addition, the PICMG AMC.0 Rx standard derived from the PICMG R3.0 standard has gradually increased the application of AMC sub-cards. The design of AMC sub-cards has become more and more complex and diverse, and more and more JTAG devices are used. The AMC standard only provides a set of JTAG interfaces. If all the JTAGs on the AMC are only strung together into a daisy chain as shown in Figure 3, as the number of devices increases, more and more BSCs in the daisy chain will inevitably affect the test speed.

This is the third disadvantage of the application of JTAG technology in ATCA

[0011] Existing patent documents include: Chinese patent application No. 200610063507.7 "A method and system for remote maintenance of JTAG devices in ATCA". , the effective download speed will be slower, seriously affecting the upgrade speed; relying on the BMC as the actuator for downloading data on the board, the BMC is the core device for the JTAG download of the board, if the BMC fails, the entire board cannot complete the online download, and there is a risk; BMC design, it is difficult to achieve system-level JTAG test, which makes JTAG technology lose its original function

[0012] In addition, the Chinese patent application No. 200710143086.3 "Boundary Scan System and Method Based on High-Performance Computing Communication Architecture" has the following disadvantages: the CMM board in the ATCA architecture cannot be upgraded from master to slave; the JTAG design of the AMC sub-card is not flexible enough , the use plan of JTAG is unclear, which may lead to increased test complexity; single board information cannot be obtained; the role of CMM in upgrading and testing has not been planned, and the test of CMM backup board may not be fully covered; the test type is single

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