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A repairable semiconductor memory device and method of repairing the same

A storage device and semiconductor technology, applied in the field of repairable semiconductor storage devices, can solve the problems of semiconductor storage devices not being able to obtain security information, failures, etc.

Inactive Publication Date: 2008-08-13
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If the OTP block is a bad or defective memory block, the semiconductor memory device may malfunction due to failure to obtain security information in the operation of the memory device

Method used

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  • A repairable semiconductor memory device and method of repairing the same
  • A repairable semiconductor memory device and method of repairing the same
  • A repairable semiconductor memory device and method of repairing the same

Examples

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Embodiment Construction

[0015] Referring to FIGS. 2-5 , the semiconductor memory device 10 includes a host interface 11 , a CPU 13 , a first storage unit 15 , a second storage unit 17 and a bus 19 . The semiconductor storage device 10 can be a memory card, compact flash, memory stick, memory stick duo (memory stick duo), multimedia card (MMC), compact MMC, secure digital (SD) card, compact SD card, micro SD card (for example, Transflash TM ), a smart media card, or an XD-picture card TM )wait. The semiconductor memory device 10 may be electrically connected to the memory slot 201 in FIG. Optionally, the storage circuit unit 10 can also be configured to transmit the stored data to the electronic circuit unit 205 of the host 5 . For example, when the host 5 is a video camera (as shown in FIG. 5A ), the electronic circuit unit 205 may include a CMOS image sensor (CIS), an image processor and a digital signal processing unit, so that the electronic Data output by the circuit unit 205 (for example, im...

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Abstract

A repairable semiconductor memory device including a memory cell array having a first block to store first system data and a second block to store second system data identical to the first system data. A controller transmits the first system data to a memory unit in response to a reset signal output from a host and the second system data to the memory unit based on a fail detection signal generated by an ECC detection block. The ECC detection block determines whether the first system data is defective. When a defect is generated in the first system data during resetting of the semiconductor memory device, the first system data is repaired by supplying the second system data.

Description

[0001] Cross References to Related Applications [0002] This application claims priority under 35 U.S.C § 119 from Korean Patent Application No. 10-2007-0013238 filed on February 8, 2007, the entire contents of which are hereby incorporated by reference. technical field [0003] Embodiments of the present invention relate to semiconductor memory devices. More particularly, embodiments of the present invention relate to repairable semiconductor memory devices and methods of repairing the semiconductor memory devices. Background technique [0004] Nonvolatile semiconductor memory devices (eg, flash memory devices) can retain data even when power is turned off. Such devices are widely used as data storage devices included in various digital electronic products such as midget PCs, personal digital assistants (PDAs), digital cameras, mobile phones, and MP3 players. Such a nonvolatile semiconductor memory device includes a memory cell array having a plurality of blocks each inc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/44G11C29/42
CPCG11C29/82G06F11/1417G11C16/34G11C29/00
Inventor 李炳勋金起弘李承源金善券
Owner SAMSUNG ELECTRONICS CO LTD