Apparatus and method for low temperature plasma body atomic emission spectra measuring trace quantity hydrargyrum

A low-temperature plasma and atomic emission spectrometry technology, applied in the field of analysis and detection, can solve the problems such as the inability to reduce the size of the instrument, the large size of the instrument, and the high cost, and achieve the effects of low daily operation consumption, simple energy supply system, and reduced size.

Inactive Publication Date: 2008-10-08
NORTHEASTERN UNIV LIAONING
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Problems solved by technology

Although it has high sensitivity and stability in practical analysis applications, it cannot adapt to the development trend of miniaturization of analytical instruments due to its large size, complex structure, high cost and high operating cost.
The main reason for this result is that, on the one hand, the use of high-temperature plasma excitation light source - inductively coupled plasma, the temperature of the plasma generated by it is very high, generally 6000-8000K, which makes the instrument energy supply equipment complicated and daily operation consumption larger
On the other hand, the structure of the traditional wavelength selection system is complicated, resulting in the inability to reduce the size of the instrument

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  • Apparatus and method for low temperature plasma body atomic emission spectra measuring trace quantity hydrargyrum
  • Apparatus and method for low temperature plasma body atomic emission spectra measuring trace quantity hydrargyrum
  • Apparatus and method for low temperature plasma body atomic emission spectra measuring trace quantity hydrargyrum

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Embodiment Construction

[0026] The present invention is further described in conjunction with accompanying drawing:

[0027] Such as figure 1 Shown is a schematic structural diagram of an embodiment of the present invention, including a vapor generation sampling system 1 , a low-temperature plasma generation chamber 2 , a high-frequency high-voltage power supply 3 and a spectrometer 4 . The vapor generation sampling system 1 is provided with a carrier flow inlet 11 , a sample inlet 12 , a reducing agent inlet 13 , a carrier gas inlet 14 , a vapor generation outlet 15 and a waste liquid outlet 16 . The software program of the vapor generation sampling system is used to control the system to perform a vapor generation reaction to generate mercury vapor. The low-temperature plasma generation chamber 2 is provided with a steam inlet 21 , a steam outlet 22 and electrodes 23 . The steam generating outlet 15 is connected to the steam inlet 21 .

[0028] see figure 2 with image 3 , the low-temperature...

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Abstract

A device and a method for detecting a trace of mercury in emission band spectrum of low temperature plasm, which belongs to an analysis and detection technology filed and includes the flowing steps that: (1) detection wavelength and background correction wavelength of the mercury are chosen; (2) a standard working curve of the mercury is drawn; (3) mercury content of solution which is to be detected is detected; the device used in the method for detecting a trace of mercury in emission band spectrum of low temperature plasm includes gasoline fractionating sample injection system, low temperature plasm generator, high-frequency and high-voltage power supply and spectrograph. The invention has beneficial effects that: medium can prevent exoelectric low temperature plasm exciting light resource, high temperature condition is not existed, power consumption is greatly decreased , and then an energy supply system is simple, cost is cheap, daily running consumption is quite low.

Description

technical field [0001] The invention belongs to the technical field of analysis and detection, and in particular relates to a device and method for measuring trace amounts of mercury by low-temperature plasma atomic emission spectrometry. Background technique [0002] The basic principle of atomic emission spectroscopic analysis technology is to use the substance to emit characteristic spectra through the atoms or ions of the elements under thermal excitation or electrical excitation to carry out qualitative and quantitative analysis of elements. This method has been widely used in the analysis of trace elements. Analysis and detection. Usually, the atomic emission spectrometer is composed of a sampling system, an excitation light source, a wavelength selection system and a detection system in structure. Inductively coupled plasma atomic emission spectrometer (ICP-AES) is the most common atomic emission spectrometer at present. It usually adopts pneumatic atomization method...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/73
Inventor 王建华于永亮杜卓陈明丽
Owner NORTHEASTERN UNIV LIAONING
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