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Pixel gain control method applied to infrared focal plane image-forming system

An infrared focal plane and imaging system technology, applied in radiation pyrometry, measuring devices, instruments, etc., can solve the problems affecting the dynamic range of instruments, poor real-time performance, and poor uniformity, and achieve good real-time performance, simple structure, and improved uniformity. sexual effect

Inactive Publication Date: 2008-11-12
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0003] Due to technological limitations and the influence of infrared background radiation, the uniformity between the output signals of each pixel of the infrared focal plane device is very poor. The traditional signal processing part only includes the overall amplitude adjustment and filtering circuit of the signal before the analog-to-digital conversion. The difference between each pixel is adjusted in the digital circuit processing part or post-processing software processing. This processing method often has poor real-time performance and affects the dynamic range of the instrument to a certain extent.

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  • Pixel gain control method applied to infrared focal plane image-forming system
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  • Pixel gain control method applied to infrared focal plane image-forming system

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Embodiment Construction

[0021] The author verified the actual effect of the invention by using a 24-element near-infrared focal plane device developed by the Shanghai Institute of Technical Physics, Chinese Academy of Sciences. The collected data such as Figure 4 as shown, Figure 4 The upper curve on the middle coordinate axis represents the response value of each pixel obtained in step A using the conventional infrared focal plane imaging system processing method; the binary value represented by the on-off state of the analog switch of each pixel obtained in step B The coding table is shown in Table 1; input the data in Table 1 in the read-only memory ROM, and complete the work of step C; Figure 4 A curve at the middle and lower side represents the response value of each pixel obtained by the system after step D is added with the pixel gain control method. The system uses a 12-bit analog-to-digital conversion chip, and the input range is -5V ~ +5V. Through the control method of pixel gain, the...

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Abstract

The present invention discloses a pixel gain control method for infrared focal plane imaging system. For area array or line array infrared focal plane device outputting serial signal, it is able to regulate single pixel response real-time through the pixel gain control method before analog-digital transformation. The method improves evenness of infrared focal plane system output signal greatly, and can enlarge instrument dynamic range in a certain extent. The method can be used for situation such as spaceflight observation of earth, prewarning satellite and the like which request high real time and signal quality of infrared focal plane system output signal.

Description

technical field [0001] The invention relates to an infrared focal plane device signal processing technology, specifically a pixel gain control method applied to an infrared focal plane imaging system, which is applied to the design of an infrared remote sensing instrument or a military reconnaissance instrument. Background technique [0002] In the field of aerospace, optoelectronic instruments composed of infrared focal plane devices as the core are important loads for satellites such as earth observation and military reconnaissance. These loads obtain the infrared radiation information of the target through the infrared focal plane device, and then process the information through the information processing module. The design of the information processing module will directly affect the overall performance of the instrument. [0003] Due to technological limitations and the influence of infrared background radiation, the uniformity between the output signals of each pixel o...

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Application Information

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IPC IPC(8): G01J5/02
Inventor 刘银年李春来陈小文孙德新张明涛谢仁飚
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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