Unlock instant, AI-driven research and patent intelligence for your innovation.

Polysilicon film preparation with controllable crystal particle dimension and detection device

A polysilicon thin film and detection device technology, which is applied in the directions of polycrystalline material growth, crystal growth, single crystal growth, etc., can solve the problems of high cost and time-consuming, film destructiveness, etc.

Inactive Publication Date: 2010-08-04
南京中安光电科技有限公司
View PDF5 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, because this detection method is destructive to the film, and it is costly and time-consuming, it is mainly used in scientific research experiments and is not suitable for industrial use.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Polysilicon film preparation with controllable crystal particle dimension and detection device
  • Polysilicon film preparation with controllable crystal particle dimension and detection device
  • Polysilicon film preparation with controllable crystal particle dimension and detection device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] The present invention will be further described below in conjunction with the embodiments and accompanying drawings, but the protection scope of the present invention should not be limited thereby.

[0025] see first figure 1 , figure 1 It is a schematic diagram of the preparation and detection device of the polysilicon thin film with controllable grain size of the present invention. It can be seen from the figure that the preparation and detection device of the polysilicon thin film with controllable grain size of the present invention consists of a laser source 1, a beam splitter 2, a beam shaping system 4, Polysilicon thin film substrate 5, optical focusing system 7, stimulated Raman spectrum receiving system 8, Raman data analysis and feedback system 9 and a mobile workbench, the positional relationship of each component is as follows: the polysilicon thin film substrate 5 set On the mobile workbench, the laser beam output by the laser source 1 is divided into the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
wavelengthaaaaaaaaaa
sizeaaaaaaaaaa
Login to View More

Abstract

The invention discloses a preparation for a polysilicon thin film with controllable grain size and a detection device thereof, which is characterized in that the invention consists of laser source, an optical splitter, a beam plastic system, a polysilicon thin film substrate, an optical focusing system, a stimulated Raman spectrum receiving system, a Raman data analyzing and feedback system and amovable worktable. The invention has the advantages that an online detection can be carried out simultaneously when the polysilicon thin film is prepared, thus providing the optimal energy density for the preparation of the polysilicon thin film; the detection is a non-destructive testing; the testing cost is low; the detection is fast; moreover, the device can accurately detect the granularity of the polysilicon thin film, promote the excellent rate and improve the capacity. The preparation for the polysilicon thin film and the detection device are applicable to the preparation and real timedetection of industrialized polysilicon thin film; the size of the grain can be accurately detected; the energy density of the laser can be monitored in real time.

Description

technical field [0001] The present invention relates to polysilicon, especially a preparation and detection device of a polysilicon thin film with controllable grain size, which is used to quickly and real-time detect the grain size of polysilicon thin film crystal grains, thereby adjusting the optimal energy density required for laser crystallization . Background technique [0002] As the core process of low temperature polysilicon (LTPS) technology, laser crystallization has a good application prospect in the field of liquid crystal display (LCD). The principle of laser crystallization is to use a laser to scan the low-temperature deposited amorphous silicon film to melt it and recrystallize it into a polysilicon film. Compared with the currently used amorphous silicon thin-film liquid crystal panels, polysilicon thin-film liquid crystal panels are cheaper and have higher resolution, because the transmission speed of electrons in polysilicon is faster and the quality is b...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): C30B29/06C30B28/02C30B33/02
Inventor 楼祺洪袁志军周军董景星魏运荣赵宏明
Owner 南京中安光电科技有限公司