The application relates to a method for obtaining nanometer-scale lines by using a
laser, and belongs to the technical field of semiconductors, which solves the problems of complicated process and extremely high cost in obtaining high-density nanometer-scale optical lines in the prior art. The method comprises the following steps: sequentially forming a
dielectric layer and an
amorphous silicon layer above a substrate; using a
laser to irradiate a
mask to perform
silicon crystallization on a partial region of the
amorphous silicon layer, wherein the
crystal boundaries of the
polycrystalline silicon formed after the partial region of the
amorphous silicon layer is subjected to
silicon crystallization are determined by the interval of the regularly-shaped apertures on the
mask; performing a planarization treatment on the
crystal boundaries of the
polycrystalline silicon of the amorphous
silicon layer; removing the
crystal boundaries to form crystal boundary grooves by using an
etching liquid; and obtaining nanometer-scale lines on the substrate by using the crystal boundary grooves. The regularly-shaped crystal boundaries formed by the method of
laser crystallization and the damascene process obtain a low-cost nanometer-scale
line array.