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Two-way output double-corner reflection body interferometer

A corner reflector and dual-output technology, applied in the field of interferometers, can solve problems such as low-resolution spectrometers, achieve the effects of improving measurement quality, eliminating tilt and lateral shift problems, and high thermal stability

Inactive Publication Date: 2008-12-24
杨庆华
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Rotating mirror or swinging mirror interferometer is also a successful solution, which eliminates the error caused by the tilt of the plane moving mirror and improves the stability and reliability of the instrument, but it is only suitable for low-resolution spectrometers

Method used

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  • Two-way output double-corner reflection body interferometer
  • Two-way output double-corner reflection body interferometer
  • Two-way output double-corner reflection body interferometer

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Embodiment Construction

[0024] The dual-output double-angle reflector interferometer consists of a beam splitter with a semi-reflective surface at a 45-degree angle on the incident beam, two fixed plane mirrors (namely the first plane mirror and the second plane mirror), and a rigid Structure Two scanning corner reflectors (i.e., first corner reflector and second corner reflector) fixed together back-to-back as a single moving part; the beam splitter may be two identical cemented right-angle prisms (see figure 2 ) or two identical glued plane-parallel glass plates (see image 3 ); the distance between the apex of the first corner reflector and the apex of the second corner reflector is extremely small; The included angles of the reflecting surfaces are all 22.5 degrees; the centers of the beam splitter, the first plane mirror and the second plane mirror are located in the same plane. The double-angle reflector makes linear reciprocating motion along the normal direction of the semi-reflecting surfa...

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Abstract

The invention discloses an interferometer with two-path output and double corner reflectors, which comprises a beam splitter, two fixed planar speculums, and two scanning corner reflectors that are fixed back to back by a rigid structure and taken as an individual moving part; the first planar speculum and the second planar speculum are symmetric with respect to a half reflecting plane of the beam splitter, and the two planar speculums form an included angle of 22.5 degrees with the half reflecting plane of the beam splitter; the double corner reflectors move repeatedly and straightly along the normal line direction of the half reflecting plane of the beam splitter; the optical path difference is 4 times of the displacement of the double corner reflectors. The interferometer generates light beams that are output in two paths and received by two detectors; the two-path signals of the detectors have same amplitudes and opposite phases, and the phase difference forms an interference pattern. The interferometer eliminates the strength distortion that is most important in Fourier transformation spectrum and caused by the nonlinearity of the detectors, absolutely eliminates the leaning and swaying problems, and is applicable to Fourier transform spectrometers with high distinguishability in various spectrum regions.

Description

technical field [0001] The invention relates to an interferometer, in particular to a dual-output dual-angle reflector interferometer applied to a high-resolution Fourier transform spectrometer. Background technique [0002] Fourier transform spectrometer has the advantages of high spectral resolution, multi-channel, high throughput and so on. However, multi-channel and high-throughput mean that the detector will receive a large number of photons when recording the interferogram, and it is usually difficult to obtain linear measurements. More importantly, the nonlinearity of the detector leads to the most important intensity of the Fourier transform spectrum. Distortion, which seriously affects the measurement quality of the transformed spectral intensity. Generally, linear measurement can be obtained by reducing the light intensity and narrowing the recording spectral range. Thus, the main advantages of the Fourier transform spectrometer are not fully utilized. [0003] ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/45G02B26/08G02B17/08
Inventor 杨庆华
Owner 杨庆华
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