Single crystal substrate and cutting method thereof
A substrate and single crystal technology, applied in electrical components, impedance networks, etc., can solve problems such as performance degradation of SAW devices
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Embodiment approach 1
[0113] Figure 4 According to an embodiment of the present invention, when Euler angle φ=10 ° in the langasite substrate of the SAW device, the contour map of pfa; Figure 5 It is the contour map of tcd when the Euler angle φ=10°.
[0114] As shown, the point where pfa and tcd are simultaneously zero is at approximately θ = 23.6° and ψ = 78.8°.
[0115] Image 6 is a flowchart illustrating a method of simulating a single crystal substrate of a SAW device according to the present invention.
[0116] refer to Image 6 , the simulation method for a single crystal substrate is described below. The user first inputs the material and temperature constant of the single crystal, temperature, search range and Euler angles (S11).
[0117] Next, the user converts the constants from the crystallographic coordinate system to the work coordinate system (S12). Thereafter, the user searches for a solution to the dispersion equation for the body wave, namely V S1 , V S2 , V 1 (S13). ...
Embodiment approach 2
[0137] Figure 10 In the quartz substrate of the SAW device according to one embodiment of the present invention, the coupling coefficient (K 2 ) and the relationship between the first-order temperature coefficient of delay (tcd); Figure 11 Shown in the quartz substrate of the SAW device according to one embodiment of the present invention, when the Euler angle φ = 0 °, θ = θ ° (θ ° refers to any angle) and ψ = 0 ° when the open surface phase velocity ( Vo) and the relationship between the temperature coefficient of second-order delay (tcd2).
[0138] like Figure 10 and 11 As shown, the maximum value of the coupling coefficient corresponds to the Euler angle θ≈70°.
[0139] According to the parameter values obtained from the simulation using Euler angles (0°, 70.5° and 0°), Vs(km / s)=3.205561, Vo(km / s)=3.208859, K 2 (%)=0.2056, pfa(deg)=0, tcd(ppm / C)=-27.78, tcd2(10 -9 / C 2 )=2.5308, and γ=1.214.
[0140] In order to use a SAW device as a temperature sensor and impr...
Embodiment approach 3
[0149] Figure 14 Shown in the lithium tantalate substrate of the SAW device according to one embodiment of the present invention, when the Euler angle φ = 0 °, θ = θ ° (θ ° refers to any angle) and ψ = 90 ° when the coupling coefficient ( K 2 ) and the relationship between the first-order temperature coefficient of delay (tcd); Figure 15 It is shown that in the lithium tantalate substrate of the SAW device according to one embodiment of the present invention, when the Euler angles φ=0°, θ=θ° (θ° refers to any angle) and ψ=90°, the open surface phase Relationship between velocity (Vo) and temperature coefficient of second-order delay (tcd2).
[0150] like Figure 14 and 15 As shown, the maximum value of the coupling coefficient depending on the first-order and second-order delay temperature coefficients corresponds to θ=79°.
[0151] According to the parameter values obtained from the simulation using Euler angles (0°, 79° and 90°), Vs(km / s)=3.247331, Vo(km / s)=3.26343,...
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