Nondestructive inspection method and device for internal defect of workpieces by x-ray diffraction x scan

A technology for internal defect, non-destructive testing, applied in measurement devices, material analysis using radiation, material analysis using wave/particle radiation, etc., can solve problems such as time-consuming and impractical
CN101358938AInactive Publication Date: 2009-02-04SOUTHWEST TECH & ENG INST
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Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
SOUTHWEST TECH & ENG INST
Publication Date
2009-02-04
Estimated Expiration
Not applicable · inactive patent

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Abstract

The present invention relates to a nondestructive testing method of X-ray diffraction which is used for detecting the internal defect of a workpiece which is made of crystal material (including single-crystal materials and polycrystalline materials) or material which contains atoms arranged in sequence along the one-dimensional space, and a device thereof, in particular suitable for detecting the internal defect of the workpiece made of material which consists of atoms of low atomic number. The method adopts the nondestructive test to get the intensity distribution map of diffraction of materials in all internal parts of the tested workpiece; then the nondestructive test is adopted to analyze the internal defect, the defect type and distribution of the tested workpiece. The X-ray tube radiation of easily available heavy metal anode target, which can be industrialized and practically applied, can be used in the rapid nondestructive test of the internal defect and the defect type of aluminum and magnesium workpieces which have a thickness of a plurality of millimeters; and the spatial resolution is superior to the existing X-ray detection machine and X-ray CT.
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Description

Technical field

[0001] The invention relates to a method and device for non-destructively detecting defects within a workpiece of crystal materials (including single crystal materials and polycrystalline materials, or materials containing atoms arranged in an orderly manner along one-dimensional space, such as fiber-reinforced composite materials) using X-ray diffraction scanning. , is especially suitable for non-destructive testing of internal defects and their distribution in workpieces made of the above-mentioned materials composed of lower atomic number atoms (hereinafter referred to as low-z materials). Background technique

[0002] At present, instruments and equipment based on X-ray transmission method or ultrasonic method are commonly used to non-destructively detect internal defects of workpiece materials, such as X-ray flaw detectors, X-ray CT or C-ultrasound scanners, etc. Among them, X-ray CT and C-ultrasound scanners can not only detect the spatial shape and siz...

Claims

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