Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Phase measurement method of surface plasma resonance and measuring system thereof

A surface plasmon and measurement method technology, applied in the field of ion resonance measurement and measurement system, can solve complex problems, achieve high sensitivity, facilitate integration and miniaturization, and reduce errors

Inactive Publication Date: 2009-04-01
THE NAT CENT FOR NANOSCI & TECH NCNST OF CHINA +1
View PDF0 Cites 24 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the phase change caused by SPR is more significant than the intensity change, it is possible to achieve a higher system sensitivity than the detection intensity, but because the experimental device and process of the phase detection currently studied are often too complicated, the current method of detecting reflected light is still commonly used. Intensity to judge the occurrence of SPR resonance

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Phase measurement method of surface plasma resonance and measuring system thereof
  • Phase measurement method of surface plasma resonance and measuring system thereof
  • Phase measurement method of surface plasma resonance and measuring system thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0041] The SPR effect can only be excited by the p-polarized incident light, and the s-polarized incident light will not produce the SPR effect, so when s-light and p-light are incident on the SPR element at the same time, the p-polarized reflected light near the SPR condition Significant amplitude and phase changes occur in the complex amplitude, while the s-polarized reflected light changes little. When the incident s-light and p-light are broad-spectrum and the incident spectrum of the two is the same, it can be expressed by the following formula:

[0042] A s (ω)=A 0 (ω)*R s (ω)≈A 0 (ω)R s，0 A p (ω)=A 0 (ω)*R p (ω) (3)

[0043] where A 0 (ω) is the complex amplitude of the incident spectrum, A s (ω) and A p (ω) are the complex amplitudes of the reflected s-light and p-light spectra, respectively, R s (ω) and Rp (ω) are the light field reflection functions of the SPR element for s-light and p-light, respectively. due to R s (ω) changes very little, so it can...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a phase measurement method and a measurement system thereof used for measuring high-precision surface plasma resonance; the method and the system utilize the polarization selectivity of the surface plasma resonance effect, polarizes the broadband light and detects the polarization by different polarization controllers, and achieves the interference of the polarization light in different polarization directions; simultaneously, interference fringes on the spectrum are generated by a certain delay difference led in among the polarization light in different polarization directions by utilizing the delay elements related to the polarization, thus achieving the object that the frequency domain phase response information of the surface plasma resonance effect is obtained by detecting the spectrum distribution with the interference fringes; therefore, complex optical systems such as interferometer and the like are avoided, the reliability and stability for system detection are increased, and integration, miniaturization and convenience are convenient for being realized. The method and the system can achieve extremely high system sensitiveness by combining a wavelength scanning type and a phase detection method.

Description

technical field [0001] The invention relates to the field of sensors and sensing technology. The invention specifically relates to a surface plasmon resonance measurement method and a measurement system for realizing the method. Background technique [0002] Surface plasmon (Surface Plasmon, referred to as SP) is a vibration mode formed by the collective oscillation of metal surface charges that propagates along the interface between the metal and the dielectric; ) on the material interface. The field strength of this mode reaches its maximum at the interface and decays exponentially along the direction perpendicular to the interface on both sides of the interface, so that the mode field is confined near the interface. The surface plasmon wave dispersion relation can be expressed as: [0003] k sp = 2 π λ ( ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N21/55G01N21/41G01N21/552
CPCG01N21/553G01N21/45
Inventor 郑铮万育航赵欣朱劲松范江峰
Owner THE NAT CENT FOR NANOSCI & TECH NCNST OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com