Phase measurement method of surface plasma resonance and measuring system thereof

A surface plasmon and measurement method technology, applied in the field of ion resonance measurement and measurement system, can solve complex problems, achieve high sensitivity, facilitate integration and miniaturization, and reduce errors

Inactive Publication Date: 2009-04-01
THE NAT CENT FOR NANOSCI & TECH NCNST OF CHINA +1
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Problems solved by technology

Although the phase change caused by SPR is more significant than the intensity change, it is possible to achieve a higher system sensitivity than the detection intensity, but because the experimental de...

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  • Phase measurement method of surface plasma resonance and measuring system thereof
  • Phase measurement method of surface plasma resonance and measuring system thereof
  • Phase measurement method of surface plasma resonance and measuring system thereof

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Embodiment Construction

[0041] The SPR effect can only be excited by the p-polarized incident light, and the s-polarized incident light will not produce the SPR effect, so when s-light and p-light are incident on the SPR element at the same time, the p-polarized reflected light near the SPR condition Significant amplitude and phase changes occur in the complex amplitude, while the s-polarized reflected light changes little. When the incident s-light and p-light are broad-spectrum and the incident spectrum of the two is the same, it can be expressed by the following formula:

[0042] A s (ω)=A 0 (ω)*R s (ω)≈A 0 (ω)R s，0 A p (ω)=A 0 (ω)*R p (ω) (3)

[0043] where A 0 (ω) is the complex amplitude of the incident spectrum, A s (ω) and A p (ω) are the complex amplitudes of the reflected s-light and p-light spectra, respectively, R s (ω) and Rp (ω) are the light field reflection functions of the SPR element for s-light and p-light, respectively. due to R s (ω) changes very little, so it can...

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Abstract

The invention discloses a phase measurement method and a measurement system thereof used for measuring high-precision surface plasma resonance; the method and the system utilize the polarization selectivity of the surface plasma resonance effect, polarizes the broadband light and detects the polarization by different polarization controllers, and achieves the interference of the polarization light in different polarization directions; simultaneously, interference fringes on the spectrum are generated by a certain delay difference led in among the polarization light in different polarization directions by utilizing the delay elements related to the polarization, thus achieving the object that the frequency domain phase response information of the surface plasma resonance effect is obtained by detecting the spectrum distribution with the interference fringes; therefore, complex optical systems such as interferometer and the like are avoided, the reliability and stability for system detection are increased, and integration, miniaturization and convenience are convenient for being realized. The method and the system can achieve extremely high system sensitiveness by combining a wavelength scanning type and a phase detection method.

Description

technical field [0001] The invention relates to the field of sensors and sensing technology. The invention specifically relates to a surface plasmon resonance measurement method and a measurement system for realizing the method. Background technique [0002] Surface plasmon (Surface Plasmon, referred to as SP) is a vibration mode formed by the collective oscillation of metal surface charges that propagates along the interface between the metal and the dielectric; ) on the material interface. The field strength of this mode reaches its maximum at the interface and decays exponentially along the direction perpendicular to the interface on both sides of the interface, so that the mode field is confined near the interface. The surface plasmon wave dispersion relation can be expressed as: [0003] k sp = 2 π λ ( ...

Claims

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Application Information

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IPC IPC(8): G01N21/55G01N21/41G01N21/552
CPCG01N21/553G01N21/45
Inventor 郑铮万育航赵欣朱劲松范江峰
Owner THE NAT CENT FOR NANOSCI & TECH NCNST OF CHINA
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