Single-pulse measurement method for nonlinear refraction coefficient of materials

Abstract

The invention discloses a single-pulse measurement method of material non-linearity refraction. A phase object is added in the detection light-path. The material non-linearity refraction is determined by measuring the non-linearity transmittance of a far-field aperture under the action of single-pulse. The single-pulse measurement method has features of simple light-path, simple data processing, single-pulse measurement, no need of moving sampler, simultaneous measurement of size and symbol of the non-linearity refraction, accurate measurement result, greatly reduced measurement cost.

Description

technical field [0001] The invention relates to a method for measuring optical nonlinear refraction of materials, belonging to the fields of nonlinear photonic materials and nonlinear optical information processing. Background technique [0002] With the rapid development of technologies in the fields of optical communication and optical information processing, the research on nonlinear optical materials is becoming increasingly important. The realization of functions such as optical logic, optical memory, optical transistor, optical switch and phase complex conjugation mainly depends on the research progress of nonlinear optical materials. [0003] Optical nonlinear measurement technology is one of the key technologies for studying nonlinear optical materials. Commonly used measurement methods include Z-scan, 4f system coherent imaging technology, Mach-Zehnder interferometry, four-wave mixing, third harmonic nonlinear interferometry, ellipsometry, phase object Z-scan, etc....

AI Technical Summary

Problems solved by technology

However, this method requires complex processing of the collected images, the detector needs to use CCD, and the requirements for CCD are relatively high, which increases the cost of measurement

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