Visible-near-infrared spectrum detecting method and spectrometer based on programmable micro-lens array

A technology of near-infrared spectroscopy and micromirror array, which is applied in spectrometry/spectrophotometry/monochromator, optical radiation measurement, and using diffraction elements to generate spectra. Problems such as difficulty in controlling the circuit, to achieve the effects of low power consumption, small size, and low price

Active Publication Date: 2009-08-19
GUANGZHOU SONDON NETWORK TECH CO LTD
View PDF0 Cites 23 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This instrument has the disadvantages of large volume, complex optical system, difficult control circuit, and long detection time.
Moreover, it i

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Visible-near-infrared spectrum detecting method and spectrometer based on programmable micro-lens array
  • Visible-near-infrared spectrum detecting method and spectrometer based on programmable micro-lens array
  • Visible-near-infrared spectrum detecting method and spectrometer based on programmable micro-lens array

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] like figure 1 As shown, the sample cell 2 of the spectrometer is set between the light source 1 and the double blaze angle reflection grating 4 of the dispersion element, and a slit 3 is set between the sample cell 2 and the double blaze angle reflection grating 4, and the double blaze angle reflection grating 4 A programmable micromirror array 6 is set on the light diffraction line of the dispersive element 4 and an imaging lens 5 is set between the dispersive element 4 and the programmable micromirror array 6, and the programmable micromirror array 6 is modulated by applying a driving voltage. A single-point visible light detector 10 and a single-point near-infrared detector 11 are arranged on the left and right sides of the micromirror array 6 . The first converging lens 7 is arranged between the visible light detector 10 and the programmable micromirror array 6, and the second converging lens 8 and a near-infrared band long-pass filter are arranged between the near-...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a visible light and near infrared spectrum detecting method based on a programmable micro-mirror array, which comprises an optical source, a sample pool, a dispersing element, an imaging device, the programmable micro-mirror array, a single-point visible light detector and a single-point near infrared detector; lights emitted from the optical source enter the dispersing element through the sample pool, the dispersed lights with various wavelengths enter the programmable micro-mirror array in parallel through the imaging lens, visible light wave band and near infrared wave band respectively correspond to a visible light micro-mirror array unit and a near infrared light micro-mirror array unit of the programmable micro-mirror array, the visible light micro-mirror array unit and the near infrared light micro-mirror array unit are simultaneously modulated by applying drive voltage, the visible lights are led into the visible light detector in time sequence, and simultaneously the near infrared lights are led into the near infrared light detector in time sequence, thus obtaining the spectrum information of physical visible lights and near infrared lights. The instruments adopted by the method have the advantages of low price, small volume, quick response speed, and portable use and being capable of simultaneously realizing the detection of visible light wave band and near infrared wave band, and the like.

Description

technical field [0001] The present invention relates to the technical field of instrumental analysis. Specifically, the present invention relates to a spectrum monitoring system based on micro-opto-electromechanical system technology that can simultaneously detect the visible light band and the near-infrared band of the detected substance. The instrument can be widely used in food Safety monitoring, environmental monitoring, biochemical analysis, medical identification, industrial process monitoring and other fields. Background technique [0002] Food safety testing and environmental monitoring are huge practical problems facing our country at present. Research on miniature, rapid, portable and cheap analyzers for food safety detection and environmental safety monitoring is a current research hotspot. Visible light spectral analysis technology and near-infrared spectral analysis technology are the most commonly used spectral analysis technologies for food safety testing and...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N21/17G02B26/08G02B5/18
CPCG01J3/021G01J3/18
Inventor 朱永韦玮王宁张洁
Owner GUANGZHOU SONDON NETWORK TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap