Chemical mechanical polishing solution
A chemical machinery, polishing liquid technology, applied in polishing compositions containing abrasives, etc., can solve problems such as reducing the removal rate of polysilicon, and achieve the effects of increasing the overall removal rate, increasing the removal rate, and increasing the removal rate.
Active Publication Date: 2010-03-10
ANJI MICROELECTRONICS TECH (SHANGHAI) CO LTD
View PDF9 Cites 6 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
The hydrophobic groups of the polymer are thought to be adsorbed on the polysilicon surface, forming a passivation layer that reduces the polysilicon removal rate
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment 1~11
[0024] Table 1 shows polishing fluids 1 to 11 of the present invention. According to the formula in the table, each component is simply mixed evenly, and the balance is water, adjusted to a suitable pH value with a pH regulator, and left to stand for 30 minutes to obtain each polishing solution. Polishing fluid.
[0025] Table 1 Polishing liquid embodiment 1~11 formula of the present invention
[0026]
[0027]
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Property | Measurement | Unit |
---|---|---|
particle diameter | aaaaa | aaaaa |
Login to View More
Abstract
The invention discloses chemical mechanical polishing solution, which comprises polishing particles and water, as well as bis-biguanide compounds, azole compounds and electrolyte. The bis-biguanide compounds and the azole compounds simultaneously contained in the polishing solution have synergic effect, and are associated with the added electrolyte, so the polishing solution can remarkably improve the velocity of removing polycrystalline silicon.
Description
technical field [0001] The invention relates to a chemical mechanical polishing liquid in semiconductor manufacturing process. Background technique [0002] With the continuous development of semiconductor technology and the continuous increase of interconnection layers in large-scale integrated circuits, the planarization technology of conductive layers and insulating dielectric layers has become particularly critical. The chemical mechanical polishing (CMP) technology pioneered by IBM in the 1980s is considered to be the most effective method for global planarization. [0003] Chemical mechanical polishing (CMP) is composed of chemical action and mechanical action and the combination of the two actions. Its equipment usually consists of a polishing table with a polishing pad (pad), and a polishing head (carrier) for carrying a chip (wafer). Among them, the grinding head fixes the chip, and then presses the front side of the chip on the grinding pad. When chemical mechan...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): C09G1/02
Inventor 王晨杨春晓荆建芬
Owner ANJI MICROELECTRONICS TECH (SHANGHAI) CO LTD
Who we serve
- R&D Engineer
- R&D Manager
- IP Professional
Why Patsnap Eureka
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com