FPGA(Field Programmable Gate Array)-based transistor feature real-time measuring controller

Abstract

The invention relates to an FPGA (Field Programmable Gate Array)-based transistor feature real-time measuring controller, comprising a microprocessor interface module, a measuring circuit interface module, a measuring process control module, a measuring parameter register set module, a measuring excitation generating module, a waveform cutting module and a measuring result caching module. The FPGA measuring controller is connected with a bus at a microprocessor end through the microprocessor interface module and is connected with a bus at an external measuring circuit end through the measuring circuit interface module; the measuring parameter register set module is used for storing the measuring parameter of the measuring controller and indicating the current measuring state; the measuring excitation generating module is used for generating digital excitation signals in accordance with the measuring process output by the measuring controller required by the measuring circuit; the waveform cutting module is used for measuring timing control; the measuring result caching module is used for preserving the measuring result of the measuring circuit; and the measuring process control module is used for coordinating operation of the modules and the measuring circuit to control ordered operation of the whole measuring process.

Description

technical field [0001] The invention belongs to real-time measurement and control technology, and relates to a measurement device for semiconductor tube characteristics based on FPGA. Based on the FPGA-based real-time measurement controller of the present invention, intelligent instrument systems suitable for various application types can be designed and put into production. Background technique [0002] Since the 1950s, there have been major breakthroughs in electronic devices, and semiconductor devices have gradually replaced electron tube devices, making the electronics industry move from the era of electron tubes to the era of semiconductors. This is a phased leap. With the emergence of semiconductor devices, testing instruments for measuring various parameters - semiconductor tube characteristic measuring instruments have also emerged correspondingly, and have developed with the development of semiconductor devices. The semiconductor tube characteristic measuring instr...

AI Technical Summary

Problems solved by technology

In this scheme, the processor performs multiple roles, reducing the real-time performance of the entire system

[0005] (2) Although some instruments have used special hardware circuits to realize part of the control functions, they only use small and medium-sized digital integrated circuits and discrete components to build control circuits. Practical applications require the use of a large number of peripheral logic circuits, the circuit design is extremely complex, and it is difficult to edit and modify the design, and the cost of the instrument remains high

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