Method for measuring temperature of cavity of epitaxial equipment
A technology of epitaxy and equipment, applied in thermometers, thermometers with directly heat-sensitive electric/magnetic elements, measuring devices, etc., can solve problems such as inability to accurately measure temperature distribution, achieve high reliability and accuracy, and operate Simple, Data-Comprehensive Effects
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[0022] figure 1 It is a flow chart of a method for measuring the temperature of the cavity of an epitaxy device in an embodiment, which includes the following steps:
[0023] Step S10, grow an oxide layer.
[0024] Prepare a wafer, use a P-type wafer with a substrate resistivity of 15-25 ohm·cm (ohm·cm), and then grow an oxide layer on the wafer. The thickness of the oxide layer can be In this embodiment, the thickness of the oxide layer is
[0025] Step S20, ion implantation.
[0026] Ion implantation is performed on the wafer on which the oxide layer has been grown. Due to the injection of P+ ions on the high-resistance substrate, the P+ ions activate during the high temperature process to release electrons e-. The higher the temperature, the more electrons e- are released, and the lower the sheet resistance. In one embodiment, when performing P+ ion implantation, the energy is 80 kiloelectron volts (KeV), and the dose / concentration is 6×10 per square centimeter 13 Atoms, and th...
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