Tri-differential confocal microscope imaging method with high axial resolution and imaging device

A confocal microscope and differential confocal technology, applied in microscopes, optics, instruments, etc., can solve the problems of low utilization of light energy, difficulty in ensuring the stability of pinhole displacement, and high requirements for the use environment, and achieve the use environment. Less demanding, improved axial resolution, simple structure

Active Publication Date: 2011-07-06
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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Problems solved by technology

However, this method has a low light energy utilization rate in weak light measurement, and because the method uses a non-common optical path structure, it is difficult to ensure the stability of the pinhole displacement, and the use environment requires high requirements.

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  • Tri-differential confocal microscope imaging method with high axial resolution and imaging device
  • Tri-differential confocal microscope imaging method with high axial resolution and imaging device
  • Tri-differential confocal microscope imaging method with high axial resolution and imaging device

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Embodiment approach

[0027] The specific implementation of the present invention is as follows: the pinhole 10 at the photodetector is bonded to one end of the pinhole axial micro-displacement device 9 with an adhesive. In this embodiment, the pinhole axial micro-displacement device 9 uses a piezoelectric ceramic scanner. The other end of the pinhole axial micro-displacement device 9 is bonded to the substrate 17. A pinhole axial micro-displacement device 9 controls the movement of the pinhole 10 along the axial direction at the light detection site. First, the signal synchronization device 12 sends a control signal. The signal synchronization device in this embodiment is a synchronization circuit board, which controls the pinhole axial micro-displacement drive device 15 to generate a drive signal. In this embodiment, the pinhole axial micro-displacement driving device 15 is a high-voltage amplifier. The high-voltage amplifier generates a driving voltage signal to drive the pinhole axial micro-disp...

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Abstract

The invention provides a tri-differential confocal microscope imaging method with high axial resolution and an imaging device. The axial resolution of the original confocal microscope is improved by tri-differential detection. In the optical path of a system, the axial position of a pinhole at the optical detecting position of the confocal microscope can be changed by a pinhole axial micro-displacement device, thus realizing tri-differential detection of signals. The imaging method and the imaging device have the advantages of ensuring the stability of the displacement of the pinhole and simultaneously improving the resolving power, and being simple to realize.

Description

Technical field [0001] The invention relates to a device and an imaging method for improving the resolution of a confocal microscope, in particular to a three-differential confocal microscope imaging method and an imaging device with axial high resolution, which realizes three-differential detection of signals to improve the common Axial resolution imaging of a focal microscope. Background technique [0002] The confocal microscope was first proposed by the American scholar M. Minsky in 1957, and obtained a US patent in 1961, with the patent number US3013467. The confocal microscope places the point light source, the point object, and the point detector in the corresponding conjugate positions, and the resolution of the system is significantly improved. The basic principles of general confocal microscopes are as follows image 3 As shown, after the light emitted by the point light source 20 passes through the objective lens 21 and the half mirror 22, it illuminates a point on the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B21/36G02B21/00
Inventor 张雨东李昊卢婧史国华
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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