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static random access memory formed on soi substrate

A static random access and memory technology, applied in static memory, instruments, electrical solid devices, etc., can solve the problem of SRAM cell bit line metal layers and other problems

Active Publication Date: 2011-12-28
SHANGHAI HUAHONG GRACE SEMICON MFG CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The technical problem to be solved by the present invention is to provide a static random access memory formed on a silicon-on-insulator substrate to solve the problem of more bit line metal layers required in the SRAM unit of the prior art

Method used

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  • static random access memory formed on soi substrate
  • static random access memory formed on soi substrate
  • static random access memory formed on soi substrate

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Embodiment Construction

[0022] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0023] The static random access memory formed on the SOI substrate provided by the present invention can be realized in various alternative ways, and the following is illustrated by a preferred embodiment. Of course, the present invention is not limited to this specific embodiment. Common substitutions known to those skilled in the art undoubtedly fall within the protection scope of the present invention.

[0024] Secondly, the present invention is described in detail using schematic diagrams. When describing the embodiments of the present invention in detail, for the convenience of illustration, the schematic diagrams are not partially enlarged according to the general scale, which should not be used as a limitation of the present inve...

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Abstract

The static random access memory formed on the silicon-on-insulator substrate of the present invention adopts an SOI substrate, and the drains of the first pull-up transistor (PU-1) and the first pull-down transistor (PD-1) pass through the SOI The first connection active region SL-1 of the substrate is connected, and the first connection active region SL-1 is connected with the source of the first transfer gate transistor (PG-1); the second pull-up transistor (PU- 2) It is connected with the drain of the second pull-down transistor (PD-2) through the second connection active area SL-2 of the SOI substrate, and the second connection active area SL-2 is connected with the second transfer gate transistor (PD-2) at the same time. The sources of PG-2) are connected to each other without using the first metal layer to realize the interconnection of each transistor, thereby saving one metal layer.

Description

technical field [0001] The invention relates to the technical field of semiconductor manufacturing, in particular to a static random access memory formed on a silicon-on-insulator substrate. Background technique [0002] Usually, the storage unit of SRAM (Static Random Access Memory) consists of two pull-down transistors (also called drive transistors), two pull-up transistors (also called load transistors) and two transfer gate transistors (also called transfer transistors, access transistors, active transistors). [0003] Such as figure 1 As shown, the circuit of a conventional SRAM memory cell in figure 1 shown in . In the storage unit 100, the two pull-up transistors (PU-1, PU-2) 110, 115 are PMOS transistors, and the two pull-down transistors (PD-1, PD-2) 120, 125 are NMOS transistors, thus forming two The flip-flop circuit of the cross-latch CMOS inverter, so that the memory cell 100 has two stable states for representing "0" and "1", two pass-gate transistors (PG-...

Claims

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Application Information

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IPC IPC(8): G11C5/06H01L27/12
Inventor 胡剑
Owner SHANGHAI HUAHONG GRACE SEMICON MFG CORP
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