Method for high-sensitivity measurement of surface optical nonlinearity of material

A high-sensitivity measurement and surface optics technology, applied in the field of optical nonlinear measurement of materials, can solve the problem that the measurement sensitivity may not meet the measurement requirements, and achieve the effect of convenient measurement method, high measurement sensitivity and simple theoretical model

Inactive Publication Date: 2012-08-01
SUZHOU MICRONANO LASER PHOTON TECH CO LTD
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Problems solved by technology

However, this method is the same as the traditional 4f phase coherent imaging technology, and its measurement sensitivity may not meet t

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  • Method for high-sensitivity measurement of surface optical nonlinearity of material
  • Method for high-sensitivity measurement of surface optical nonlinearity of material
  • Method for high-sensitivity measurement of surface optical nonlinearity of material

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Embodiment Construction

[0023] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0024] see figure 1 As shown, a method for measuring nonlinear parameters of a material surface with high sensitivity, the optical path is composed of a beam splitter, a convex lens, a small hole, a baffle, a detector, etc.; the pulse laser is focused on the sample 10 to be tested.

[0025] figure 1 It is an experimental device diagram of a non-linear method for measuring materials with a high-sensitivity flat-hat light single pulse in the present invention. The experimental setup can be divided into two parts, the measurement system and the reference system. The measurement system consists of a small hole 2, a convex lens 3, a sample to be measured 10, a second beam splitter 11, a convex lens 12, a second detector 13, a circular small hole 14, a circular baffle 15, a convex lens 16 and a third detector 17 compositions. Wherein, the sample 10 to be ...

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Abstract

The invention discloses a method for high-sensitivity measurement of surface optical nonlinearity of a material, and belongs to the fields of nonlinear photonics materials and nonlinear optical information processing. According to the method, incident laser is divided into two paths through a beam splitter mirror, wherein one path of the incident laser serves as detecting light and enters a measuring optical path, a round small hole and a round baffle plate are arranged in an optical path reflected by the surface of a sample; and the other path of the incident laser serves as reference light. Under the action of a single pulse, nonlinear absorption and nonlinear refractive indexes of the material are determined by measuring nonlinear reflectivity of an opening and the combination of a far-field round small hole and the baffle plate. A measuring system which is operated according to the method has the advantages of simple optical path, very high measuring sensitivity, no movement of samples, single-pulse measurement and the like, and cannot easily damage a medium.

Description

technical field [0001] The invention relates to a method for measuring optical nonlinearity of materials, which belongs to the field of nonlinear photonic materials and nonlinear optical information processing. Background technique [0002] With the rapid development of technologies in the fields of optical communication and optical information processing, the research on nonlinear optical materials is becoming increasingly important. The realization of functions such as optical logic, optical memory, optical transistor, optical switch and phase complex conjugation mainly depends on the research progress of nonlinear optical materials. Optical nonlinear measurement technology is one of the key technologies for studying nonlinear optical materials. Commonly used measurement methods include Z-scan, 4f system coherent imaging technology, Mach-Zehnder interferometry, four-wave mixing, third harmonic nonlinear interferometry, ellipsometry, phase object Z-scan, etc. Among them, ...

Claims

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Application Information

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IPC IPC(8): G01N21/41G01N21/17
Inventor 宋瑛林杨俊义刘南春杨勇刘小波
Owner SUZHOU MICRONANO LASER PHOTON TECH CO LTD
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