Single-chip horizontal packaging, packaging-after-etching and pad-embedded packaging structure and manufacturing method thereof

A technology of packaging structure and manufacturing method, applied in semiconductor/solid-state device manufacturing, electrical components, electrical solid-state devices, etc. Effects of less stress and deformation, reduced environmental pollution, and improved safety

Active Publication Date: 2015-01-14
JCET GROUP CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0019] 3. Glass fiber itself is a kind of foaming material, so it is easy to absorb moisture and moisture due to the storage time and environment, which directly affects the safety capability or reliability level of reliability;
[0020] 4. The surface of the glass fiber is covered with a copper foil metal layer thickness of about 50-100 μm, and the etching distance between the metal layer line and the line can only achieve an etching gap of 50-100 μm due to the characteristics of the etching factor (etching factor: minimum The best manufacturing capability is that the etching gap is approximately equal to the thickness of the object being etched, see Figure 50 ), so it is impossible to truly design and manufacture high-density circuits;
[0022]6. Also because the entire substrate material is made of glass fiber, the thickness of the glass fiber layer is obviously increased by 100~150μm, and it cannot be really ultra-thin encapsulation;
[0023]7. Due to the large difference in material characteristics (expansion coefficient) of the traditional glass fiber plus copper foil technology, it is easy to cause stress deformation in the harsh environment process, directly Affects the accuracy of component loading and the adhesion and reliability of components and substrates

Method used

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  • Single-chip horizontal packaging, packaging-after-etching and pad-embedded packaging structure and manufacturing method thereof
  • Single-chip horizontal packaging, packaging-after-etching and pad-embedded packaging structure and manufacturing method thereof
  • Single-chip horizontal packaging, packaging-after-etching and pad-embedded packaging structure and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0135] Example 1: Single base island single turn pin

[0136] Referring to FIG. 22(A) and FIG. 22(B), FIG. 22(A) is a schematic structural diagram of Embodiment 1 of the single-chip front-mounting of the present invention, which is etched first and then packaged with the base island embedded in the package structure. Fig. 22(B) is a top view of Fig. 22(A). It can be seen from Fig. 22(A) and Fig. 22(B) that the single chip of the present invention is etched first and then packaged with a base island embedded packaging structure, which includes a base island 1 and pins 2, and the front side of the base island 1 is electrically conductive. Or the non-conductive adhesive substance 3 is provided with a chip 4, the front of the chip 4 is connected with the front of the pin 2 by a metal wire 5, the area around the base island 1, the area between the base island 1 and the pin 2 The area, the area between pin 2 and pin 2, the area above base island 1 and pin 2, the area below base isl...

Embodiment 2

[0180] Example 2: ESD ring with single-base island and single-turn pins

[0181] Referring to FIG. 23(A) and FIG. 23(B), FIG. 23(A) is a schematic structural diagram of Embodiment 2 of the single-chip front-mounting of the present invention, which is etched first and then packaged with the base island embedded in the package structure. FIG. 23(B) is a top view of FIG. 23(A). It can be seen from Fig. 23(A) and Fig. 23(B) that the difference between Embodiment 2 and Embodiment 1 is that an electrostatic discharge ring 10 is provided between the base island 1 and the pin 2, and the The front of the ESD ring 10 is connected to the front of the chip 4 through a metal wire 5 .

Embodiment 3

[0182] Example 3: Single base island single turn pin passive device

[0183] Referring to FIG. 24(A) and FIG. 24(B), FIG. 24(A) is a schematic structural diagram of Embodiment 3 of the single-chip front-mounting of the present invention, which is etched first and then packaged with the base island embedded in the package structure. Fig. 24(B) is a top view of Fig. 24(A). It can be seen from Fig. 24(A) and Fig. 24(B) that the difference between Embodiment 3 and Embodiment 1 is only that: the conductive bonding material is used to bridge the passive between the pin 2 and the pin 2 The device 11, the passive device 11 may be connected between the front of the pin 2 and the front of the pin 2, or may be connected between the back of the pin 2 and the back of the pin 2.

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Abstract

The invention relates to a single-chip horizontal packaging, packaging-after-etching and pad-embedded packaging structure and a manufacturing method thereof. The structure comprises pads (1) and pins (2). A chip (4) is arranged on the right sides of the pads (1), and the right side of the chip (4) and the right sides of the pins (2) are connected through metal wires (5). Molding compounds (6) are packaged on the peripheries of the pads (1) and the pins (2) and outside the chip (4) and the metal wires (5). Holes (7) are opened on surfaces of the molding compounds (6) on the lower portions of the pins (2) and communicated with the reverse sides of the pins (2). Metal balls (9) are arranged in the holes (7) and contacted with the reverse sides of the pins (2). The single-chip horizontal packaging, packaging-after-etching and pad-embedded packaging structure and the manufacturing method thereof have the advantages of reducing manufacturing costs, improving safety and reliability of packaging bodies, reducing environmental pollution, and being capable of designing and manufacturing high-density lines.

Description

technical field [0001] The invention relates to a single-chip front-mounting first etching and then packaging base island embedded packaging structure and a manufacturing method thereof. It belongs to the technical field of semiconductor packaging. Background technique [0002] The manufacturing process flow of the traditional high-density substrate package structure is as follows: [0003] Step 1, see Figure 38 , take a substrate made of glass fiber material, [0004] Step two, see Figure 39 , opening holes at desired locations on the fiberglass substrate, [0005] Step three, see Figure 40 , coated with a layer of copper foil on the back of the glass fiber substrate, [0006] Step 4, see Figure 41 , fill the conductive material in the position where the glass fiber substrate is punched, [0007] Step five, see Figure 42 , coated with a layer of copper foil on the front of the glass fiber substrate, [0008] Step six, see Figure 43 , coated with a photoresis...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/495H01L23/31H01L21/50C25D7/12
CPCH01L2224/92247H01L24/97H01L2924/15311H01L2224/48091H01L2224/97H01L2224/73265H01L2224/49171H01L2924/01322H01L2924/181
Inventor 王新潮李维平梁志忠
Owner JCET GROUP CO LTD
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