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Manufacture method of trench MOS (Metal Oxide Semiconductor) transistor

A technology of MOS transistor and manufacturing method, applied in the field of semiconductor manufacturing process

Active Publication Date: 2013-02-27
SHANGHAI HUAHONG GRACE SEMICON MFG CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the three processes of well implantation, source implantation, and contact hole formation are completed in three steps, three photomasks are required to complete these three processes.

Method used

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  • Manufacture method of trench MOS (Metal Oxide Semiconductor) transistor
  • Manufacture method of trench MOS (Metal Oxide Semiconductor) transistor
  • Manufacture method of trench MOS (Metal Oxide Semiconductor) transistor

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Embodiment Construction

[0020] In order to make the content of the present invention clearer and easier to understand, the content of the present invention will be described in detail below in conjunction with specific embodiments and accompanying drawings.

[0021] figure 2 A flow chart of a method for manufacturing a trench MOS transistor according to an embodiment of the present invention is schematically shown.

[0022] Such as figure 2 As shown, the method for manufacturing a trench MOS transistor according to an embodiment of the present invention includes:

[0023] trench forming step S1, for forming trenches in the silicon wafer;

[0024] Gate structure forming step S2, for forming a gate structure in the trench;

[0025] The interlayer dielectric deposition and etching step S3 is used to deposit the interlayer dielectric layer L1, and form two kinds of contact hole patterns in the interlayer dielectric layer by etching, one is corresponding to the contact hole contact with the active re...

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Abstract

The invention relates to a manufacture method of a trench MOS transistor. The manufacture method comprises the following steps of: forming a trench in a silicon wafer; forming a gate structure in the trench; depositing an interlayer dielectric layer and forming patterns of two contact holes in the interlayer dielectric layer by etching, wherein one pattern corresponds to the contact hole contacted with an active region, and the other pattern is taken as a peripheral protection ring of a device; injecting ions B and P into the two contact holes, forming a well region and a source region in the active region, and meanwhile, forming a protection ring in a protection ring region; depositing tetraethoxysilane in the patterns of the two contact holes; depositing boro-phospho-silicate-glass in the patterns of the two contact holes; carrying out backflow on the boro-phospho-silicate-glass, and sealing the contact hole in the protection ring region; carrying out etching on the boro-phospho-silicate-glass to form a separator of the contact hole contacted with the active region, thereby shrinking an initial key size of the contact hole contacted with the active region as a final key size; etching a silicon substrate by taking tetraethoxysilane and the boro-phospho-silicate-glass as baffle layers to form the contact hole contacted with the active region; and forming a contact hole baffle layer, depositing metals, and etching the metals.

Description

technical field [0001] The invention relates to a semiconductor manufacturing process, more specifically, the invention relates to a method for manufacturing a trench type MOS transistor. Background technique [0002] Trench MOS (trench MOS) transistor, as a new type of vertical structure device, is developed on the basis of VDMOS (vertical double diffused metal-oxide semiconductor field effect transistor), both of which are high cell density devices. However, compared with the former, this structure has many performance advantages: such as lower on-resistance, low gate-to-drain charge density, thus low conduction and switching losses and fast switching speed. At the same time, since the channel of the trench MOS is vertical, the channel density can be further increased and the chip size can be reduced. [0003] figure 1 is a cross-sectional view of a conventional trench MOS transistor. Such as figure 1 As shown, a conventional trench MOS transistor includes a semiconduc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/336H01L21/28
Inventor 吴亚贞楼颖颖刘宪周肖培冯凯
Owner SHANGHAI HUAHONG GRACE SEMICON MFG CORP
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