Memory and memorizing method thereof

Abstract

The invention discloses a memory which comprises an on-chip program area and an on-chip data area that are arranged for a normal working mode, an on-chip program area and on-chip data area exchange enable pin, an on-chip address encoder or an address arbiter module, a first selector, and a second selector, wherein the on-chip program area and on-chip data area exchange enable pin provides an enable signal for exchanging the on-chip program area and the on-chip data area; the on-chip address encoder or the address arbiter module receives the enable signal, and outputs a program area bus accessing to the on-chip program area, and a data area bus accessing to the on-chip data area; the first selector is provided with a selection end for receiving the enable signal, an input end for receiving the program area bus, an input end for receiving the data area bus, and an output end connected with the on-chip program area; and the second selector is provided with a selection end for receiving the enable signal, an input end for receiving the program area bus, an input end for receiving the data area bus, and an output end connected with the on-chip data area. The memory has the advantages of flexible testing, high client code density, and the like. The invention further discloses a memorizing method of the memory.

Description

technical field [0001] The invention relates to the field of chip testing, in particular to a memory and a storage method thereof. Background technique [0002] Phase-change memory testing is a staple of non-volatile flash memory testing. figure 1 It is a schematic structural view of an independent phase-change memory 8; wherein the on-chip program area 80 is realized by a read-only memory (ROM, Read Only Memory), and the on-chip data area 82 is realized by a static random access memory (SRAM, StaticRandom Access Memory) and the memory array 84 is implemented by a phase-change memory (PCM, Phase-Change Memory). Microcontroller core 86 accesses on-chip program area 80 , on-chip data area 82 , and on-chip register area 88 , and accesses on-chip memory array 84 through the output of on-chip register area 88 . [0003] In fact, the reason why the on-chip program area 80 usually uses ROM is because high temperatures will be generated on the chip during packaging and board-level...

AI Technical Summary

Problems solved by technology

[0005] The invention overcomes the defects of lack of test flexibility and low density of customer code in the prior art, and proposes a memory and its storage method

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