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Beam cluster parameter measuring system for low-energy heavy ions and frequency resonance energy selection energy measuring method

A measurement system and parameter measurement technology, which is applied in the field of beam parameter measurement of low-energy heavy ions, can solve the problems of low energy dispersion measurement resolution of low-energy heavy ion sources, space charge effect beam cluster dispersion, etc., and achieve beam saving Longitudinal transmission space of clusters, the effect of reducing cluster performance, and the effect of high resolution

Active Publication Date: 2013-07-17
SHANGHAI INST OF APPLIED PHYSICS - CHINESE ACAD OF SCI +1
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  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a beam parameter measurement system for low-energy heavy ions, and a method for measuring the energy of frequency resonance energy selection, so as to solve the problem of beam cluster dispersion caused by space charge effects in the prior art, which in turn leads to low-energy heavy ions The measurement resolution of the energy divergence of the source is not high, and it is necessary to add new equipment to realize the measurement of the three parameters of energy divergence, emittance and ion ratio

Method used

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  • Beam cluster parameter measuring system for low-energy heavy ions and frequency resonance energy selection energy measuring method
  • Beam cluster parameter measuring system for low-energy heavy ions and frequency resonance energy selection energy measuring method
  • Beam cluster parameter measuring system for low-energy heavy ions and frequency resonance energy selection energy measuring method

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Embodiment 1

[0034] Embodiment 1 energy divergence measurement

[0035] Adjust the electrode spacing of the front and rear plate excitation electrodes 23, 24 to the 5mm range, adjust the measurement probe 2 in the vacuum to a suitable position through the stepping motor drive platform 1, and make the bunches without any excitation power The efficiency of selecting the slits 21 and 22 through the front and rear positions is the highest, that is, the reading of the Faraday cup 25 is the largest; then the external excitation source 4 is switched to the frequency sweep excitation source 41, and now the frequency sweep excitation source 41 sends a peak voltage of 150V. Sweep the excitation power, and make the excitation signals applied on the front and rear plate excitation electrodes 23, 24 reverse phase through wiring.

[0036] figure 2 It is a schematic diagram of the results of the finite element simulation of the ion flight trajectory with ideal energy and a certain energy deviation when...

Embodiment 2

[0043] Embodiment 2 Emissivity measurement

[0044] Drive the platform 1 by the stepping motor to adjust the measuring probe 2 in the vacuum to a proper position. Without any excitation power, the efficiency of the bunches passing through the front and rear position selection slits 21 and 22 is the lowest at this time, that is, the Faraday cage 25, the reading is the smallest, and at the same time, record the approximate center position of the bunch at this time; then switch the external excitation source 4 to a triangular wave excitation source 42, and at this time, the excitation signals added on the front and rear plate excitation electrodes 23 and 24 are in phase. Obviously, the working state of the system at this time is equivalent to the Alison electrical deflection emittance measurement device described in the literature of P.W.Allison et al. Under a certain scanning voltage, the selection condition that ions can pass through the rear position selection slit 22 is that ...

Embodiment 3

[0058] Embodiment 3 Ion ratio measurement:

[0059] For ion ratio measurements, the basic principle is close to that of energy spread measurements. When energy divergence is measured, the excitation frequency with the maximum passing probability corresponds to D + Time-of-flight of ions in the electrode, for a D of 70keV + For ions, the excitation frequency with maximum pass probability is 25.8 MHz. When ion ratio measurement, such as D 2 + measurement due to its relationship with D + The ions have the same longitudinal energy but double the mass, and their β value is 0.0061, so the excitation frequency with the maximum passing probability is 18.3MHz. Figure 5 for D 2 + The simulation results show that the frequency difference caused by different mass numbers is far greater than the frequency dispersion caused by the energy divergence, and the charges collected by the Faraday cup 25 do not interfere with each other in the two frequency bands during the frequency sweep....

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Abstract

The invention provides a beam cluster parameter measuring system for low-energy heavy ions and a frequency resonance energy selection energy measuring method. The measuring system comprises a stepper motor driving platform, a measuring probe in vacuum, a data acquisition system and an external exciting source; the measuring probe in vacuum comprises front and rear position selection slots, front and rear flat plate exciting electrodes and a Faraday cylinder, wherein the measuring probe in vacuum is loaded onto the stepper motor driving platform; the external exciting source is electrically connected with the front and the rear flat plate exciting electrodes respectively; and the data acquisition system is connected with the Faraday cylinder. Energy measurement is converted into frequency measurement, the through probability of the ions is measured by using the Faraday cylinder to replace the measurement on beam cluster size when conventional energy divergence is measured, so that the interference of space charge effect is prevented, and the measurement resolution ratio is obviously improved; and the measurements of three parameters including beam cluster energy divergence with high resolution ratio, ion ratio and emittance can be simultaneously realized through single measuring equipment.

Description

technical field [0001] The invention relates to the measurement of bunch parameters of low-energy heavy ions, and more particularly relates to a measurement system of bunch parameters for low-energy heavy ions and a method for measuring energy of frequency resonance selective energy. Background technique [0002] Generally speaking, it is necessary to diagnose various parameters of the bundle output by the ion source, such as emittance, energy divergence, and ion ratio, in order to rationally design various accelerator parameters to utilize the bundle. For electronic machines, due to the small static energy of the output electron beam, the β value of the beam cluster output by the electron gun is already close to 1, and the influence of space charge effect can be ignored during diagnosis, and various diagnoses can be arranged in a sufficient space distance Instruments measure various parameters. However, for the low-energy heavy ion beams output by the heavy ion source, sin...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/29
Inventor 袁任贤周伟民冷用斌陈之初陈杰叶恺容俞路阳阎映炳
Owner SHANGHAI INST OF APPLIED PHYSICS - CHINESE ACAD OF SCI
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