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Method for rapidly identifying scab resistance of wheat

A technology for wheat scab and wheat scab, which is applied in the directions of microorganism-based methods, biochemical equipment and methods, and microbial determination/inspection, and can solve the problem of increasing identification operation steps, inability to perform in vivo identification, and inability to guide production. Practice and other problems, to achieve the effect of more identification results, fast, efficient and accurate identification, and simple response methods

Inactive Publication Date: 2013-09-04
SICHUAN AGRI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The main technical defects of this type of method are: firstly, the determination of physiological and biochemical parameters requires in vitro plant materials, which cannot be used for identification in vivo, which increases the identification operation steps; The probability of error is high, and the identification results will also be affected by cumulative errors; finally, the theoretical basis of the identification method is derived from the general adversity physiological ecology of plants under environmental stress. Correspondence, so this method is not applicable
Especially for ear reaction diseases such as head blight, the actual identification effect of this method is weak, and it is almost impossible to guide production practice

Method used

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  • Method for rapidly identifying scab resistance of wheat
  • Method for rapidly identifying scab resistance of wheat
  • Method for rapidly identifying scab resistance of wheat

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0065] intercellular CO 2 The concentration value Ci was used to identify the resistance of wheat materials to head blight. figure 1 Shown is the technical circuit diagram.

[0066] 1. Plant material and planting

[0067] Resistant material: wheat head blight resistant strain L693

[0068] Susceptible material: Wheat head blight susceptible strain L661

[0069] L693 and L661 were sown in the experimental field of Sichuan Agricultural University Farm in Wenjiang District, Chengdu at the end of October 2012. The row length is 3m, the row spacing is 0.5m, and the plant spacing is 0.3m.

[0070] 2. Field inoculation of wheat head blight

[0071] Single-flower instillation: select 45 plants for each material, inoculate one panicle per plant and mark it with a hang tag. In the second and fourth florets of a pair of spikelets in the middle of the ear at the flowering stage, inject 5 μL of conidia of Fusarium rubella with a pipette gun (concentration: 200 μL -1), cover the whol...

Embodiment 2

[0080] The resistance of wheat materials to head blight was identified by using the limit value Ls of the stomata in the panicle of the plant.

[0081] Parts 1, 2, and 3 of the identification process are the same as in Example 1.

[0082] 4. Correlation analysis between statistics of Ls value and resistance level

[0083] Table 2 Ls value and significance test of panicles of L661 and L693

[0084]

[0085] Table 2 shows that at 24h and 72h after inoculation, the L693Ls value did not change significantly before and after inoculation (P>0.05), and it was identified as a resistant material; the L661Ls value decreased significantly (P<0.05), and it was identified as a susceptible material. The identification result is consistent with the identification result recorded in Comparative Example 1.

Embodiment 3

[0087] The relative change rate of stomatal conductance value Gs and net photosynthetic rate value Pn at the panicle of the plant was used to identify the resistance of wheat materials to head blight.

[0088] Parts 1, 2, and 3 of the identification process are the same as in Example 1.

[0089] 4. Correlation analysis between statistics of Gs value and Pn value and resistance level

[0090] Table 3 L661 and L693 ear Gs and Pn values ​​and significance test

[0091]

[0092]

[0093] Table 3 shows that at 24h and 72h after inoculation, the change of Gs value and Pn value of L693 is synchronized, that is, the T test value (or P test value) is roughly the same, and it is identified as a resistant material; the change of Gs value and Pn value of L661 is not synchronized (Specifically, Gs>Pn in this embodiment) is identified as a susceptible material. The identification result is consistent with the identification result recorded in Comparative Example 1.

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Abstract

The invention discloses a method for rapidly identifying scab resistance of a wheat. The invention provides an identification method for identifying the resistance characteristic of the detected wheat against gibberellic disease by utilizing change of physiological parameters of wheat photosynthesis organs related to photosynthesis before or after the wheat is infected with bacteria aiming at the defects of the identification method in the prior art that the identification process is time-consuming and the identification result is affected by artificial subjective factors. The concrete physiological parameters include an intercellular CO2 concentration value Ci, a limiting value Ls of stomata, relative difference degree of a stomatal conductance value Gs and a net photosynthetic rate value Pn, variation amplitude of the net photosynthetic rate value Pn, and the like. According to the technical scheme provided by the invention, one or more parameters are used for indentifying resistance characteristic of the gibberellic disease of wheat plants individually or all together. The invention also provides a preferable method in which wheatear parts are used as photosynthesis organs. The method is high in identification result accuracy, high in repeated reproducibility level, fast and efficient, and can be suitable for living plant identification.

Description

technical field [0001] The invention relates to an identification method for wheat disease resistance, in particular to a rapid identification method for wheat scab resistance, and belongs to the field of crop disease resistance cultivation. Background technique [0002] Wheat head blight is a wheat ear disease caused by a variety of Fusarium fungi. It is an important worldwide disease that threatens wheat production. has been receiving much attention. The fundamental way to control wheat scab disease is to cultivate and popularize disease-resistant varieties, and the discovery and rapid identification of scab-resistant gene resources is the key link in cultivating resistant varieties. Accurate, stable, and reproducible resistance identification methods are the prerequisite for screening new scab resistance gene resources, and are also important measures to increase the accuracy of disease resistance research. [0003] There are two methods for identifying wheat scab resis...

Claims

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Application Information

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IPC IPC(8): C12Q1/18C12R1/645
Inventor 罗培高李鑫徐梦杨杰智张敏任正隆张怀渝
Owner SICHUAN AGRI UNIV
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