Method for measuring and calculating drift angle and deflection of single crystal plane

Abstract

The invention discloses a method for measuring and calculating a drift angle and deflection of a single crystal plane, and belongs to the technical field of oriented detection on a single crystal material. The prior art needs repeated drift angle orientation on crystals. The method comprises the following steps of 1, measuring diffraction angles of any three points on the same plane of a crystal plane to be measured by an X-ray crystal orientation instrument and marking positions of the measured three points, 2, joining the three points to form a triangle, measuring length of sides of the triangle and calculating interior angles, 3, building a space rectangular coordinate system, 4, building an equation set of known quantity and unknown quantity based on the space rectangular coordinate system, calculating coordinates of the three points and their projection points, and calculating normal vectors of the crystal plane to be measured and an ideal crystal plane, 5, calculating a drift angle of the measured crystal plane relatively to the ideal crystal plane according to a crystal system crystal-plane included-angle formula, and calculating deflection of the measured crystal plane relatively to the ideal crystal plane according to a space two-direction vector included-angle formula, and 6, adjusting a crystal cutting direction according to the drift angle and the deflection, and carrying out one-step cutting to obtain a crystal plane according with crystal orientation.

Description

technical field [0001] The invention relates to a method for measuring and calculating the declination angle and deflection of a single crystal plane. Based on an ordinary X-ray crystal orientation instrument, the declination angle and deflection of a single crystal plane are measured and calculated, belonging to the technical field of orientation detection and processing of single crystal materials. Background technique [0002] Single crystal materials have anisotropic characteristics, and optical components made of them have important applications in the field of optics. The blank for processing optical elements of single crystal material is a grown single crystal bar. After rough cutting, any crystal plane is accurately oriented and then fine cut. The accurate orientation detection of any crystal plane is called crystal orientation. For the actual processing of single crystal materials, crystal orientation is usually to measure the relationship between different parts of...

AI Technical Summary

Problems solved by technology

[0005] In order to solve the problem that the existing X-ray crystal orientation instrument needs to repeatedly orient the crystal at off-angles, and at the same time, get rid of the existing dependence on the ideal crystal plane and crystal orientation distribution map of the measured crystal and expensive equipment by the Laue photographic method, We have invented a single crystal plane off-angle and deflection calculation method

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