Unlock instant, AI-driven research and patent intelligence for your innovation.

Three-dimensional memory (3D-M) with reading/writing voltage generator chip

A technology of three-dimensional storage and read-only memory, which is applied in the direction of electrical solid-state devices, semiconductor/solid-state device components, circuits, etc., and can solve problems such as inability to reduce costs, increase costs, and troublesome intermediate circuit design

Active Publication Date: 2014-03-12
CHENGDU HAICUN IP TECH
View PDF6 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Since the three-dimensional memory array uses a complicated back-end process, and the back-end process of the intermediate circuit is relatively simple, the direct result of blindly integrating the intermediate circuit and the three-dimensional memory array is that the intermediate circuit has to be manufactured with the expensive process of manufacturing the three-dimensional memory array. circuit, which not only cannot reduce the cost, but will increase the cost
In addition, since the intermediate circuit can only use the same number of metal layers as the three-dimensional memory array (for example, only two layers), the design of the intermediate circuit is more troublesome, and the required chip area is larger.
On the other hand, since 3D-M storage elements generally undergo high-temperature processes, the intermediate circuit needs to use high-temperature-resistant interconnection materials, such as tungsten (W), which will degrade the overall performance of 3D-M

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Three-dimensional memory (3D-M) with reading/writing voltage generator chip
  • Three-dimensional memory (3D-M) with reading/writing voltage generator chip
  • Three-dimensional memory (3D-M) with reading/writing voltage generator chip

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] In the present invention, " / " represents the relationship of "and" or "or". For example, a read / write voltage generator means that it can generate only read voltages, or only write voltages, or both read and write voltages; an address / data converter means that it can only convert addresses, or only data, or both Convert address and voltage.

[0029] Figure 2A - Figure 2B Two separate 3D-M 50 containing read / write voltage generator chips are shown. These embodiments all contain at least one three-dimensional array chip (three-dimensional circuit) and at least one read / write voltage generator chip (two-dimensional circuit). Among them, the three-dimensional array chip is built in three-dimensional space and contains multiple functional layers (ie storage layers), and the read / write voltage generator chip is built in two-dimensional space and contains only one functional layer. Separating 3D and 2D circuits into separate chips allows them to be optimized separately. ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a 3D-M with a reading / writing voltage generator chip. The 3D-M comprises at least one independent 3D array chip (30) and one independent reading / writing voltage generator chip (40), wherein the 3D array chip (30) contains multiple 3D storage arrays (22aa...), and the reading / writing voltage generator chip (40) provides at least one reading / writing voltage (VR / VW) different from a power supply voltage (VDD) for the 3D array chip (30). The 3D-M can support multiple 3D array chips (30a, 30b...).

Description

technical field [0001] The present invention relates to the field of integrated circuit memories, more precisely three-dimensional memories (3D-M). Background technique [0002] Three-dimensional memory (3D-M) is a monolithic semiconductor memory that consists of multiple memory layers stacked on top of each other. 3D-M includes three-dimensional read-only memory (3D-ROM) and three-dimensional random access memory (3D-RAM). 3D-ROM can be further divided into three-dimensional mask programmed read-only memory (3D-MPROM) and three-dimensional electrically programmed read-only memory (3D-EPROM). Based on its programming mechanism, 3D-M can contain memristor, resistive random-access memory (RRAM or ReRAM), phase-change memory (PCM), programmable metallization memory (PMM), or conductive-bridging random-access memory (CBRAM). [0003] US Patent No. 5,835,396 discloses a 3D-M, namely 3D-ROM. Such as Figure 1A As shown, the 3D-M chip 20 includes a substrate layer OK and a plura...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L23/488H01L25/065H01L25/16
CPCH01L24/06H01L2224/48091H01L2924/181H01L2924/00014H01L2924/00
Inventor 张国飙
Owner CHENGDU HAICUN IP TECH