An embedded boundary scan data compression and synthesis method and device

A boundary scan and data compression technology, applied in the direction of electronic circuit testing, etc., can solve the problems of inability to perform boundary scan tests with large amounts of data, small storage space, etc., to reduce test time and test overhead, compress data volume, and save storage effect of space

Active Publication Date: 2017-01-18
BEIJING AEROSPACE MEASUREMENT & CONTROL TECH
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to compress and synthesize the embedded boundary scan data, so as to solve the problem that the embedded boundary scan test device in the prior art has a small storage space and cannot perform boundary scan tests with a large amount of data

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • An embedded boundary scan data compression and synthesis method and device
  • An embedded boundary scan data compression and synthesis method and device
  • An embedded boundary scan data compression and synthesis method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] In order to solve the problem that the storage space of the embedded boundary scan test device in the prior art is small, and the boundary scan test with a large amount of data cannot be performed, the present invention provides an embedded boundary scan data compression and synthesis method and device, which will be combined with the accompanying drawings below And embodiment, the present invention is described in further detail. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0023] The present invention relates to proper nouns: scanning unit, scanning chain.

[0024] Scanning unit: Located at the input pin and output pin of the chip, it is a shift register between the input pin and output pin and the core circuit.

[0025] Scan chain (Boundary-Scan Chain): Connect the scan units on the pins of the chip in sequence to obtain a scan chain. The length of the scan...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses an embedded boundary scan data compression and synthesis method and device. The method comprises the steps of: obtaining a standard scan chain data; obtaining a pin data used in the test, a test matrix and a response matrix; storing the standard scan chain data, the pin data used in the test, the test matrix and the response matrix into the chip of the embedded test device; obtaining the standard scan chain data, the pin data used in the test, the test matrix and the response matrix stored in the chip; calculating the position of the scan unit on the standard scan chain data of each pin used in the test to use the vector synthesis standard scan chain data in the test matrix and the vector synthesis standard scan chain data in the response matrix. The method and device effectively solves the problems of small storage space and being unable to conduct the boundary scan test of a large quantity of data of the test device. The data quantity of the boundary scan datum is effectively compressed, storage space is saved, test time and cost are reduced, and production efficiency is increased.

Description

technical field [0001] The invention relates to the technical field of boundary scan testing, in particular to an embedded boundary scan data compression and synthesis method and device. Background technique [0002] Boundary scan technology is the mainstream design-for-test technology for fault detection and diagnosis of complex circuit boards. In the prior art, the boundary-scan test system based on the boundary-scan technology can complete tasks such as test generation, test vector loading, test response analysis, fault display and auxiliary functions. [0003] Embedded boundary-scan technology is a combination of boundary-scan test technology and embedded test technology, and its purpose is to solve heavy testing and diagnosis problems. In the embedded boundary scan technology, the performance of the external boundary scan engine is designed into the test device to enhance test automation, improve test coverage and test efficiency, and reduce test maintenance costs thro...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
Inventor 杜影李洋徐鹏程王石记安佰岳
Owner BEIJING AEROSPACE MEASUREMENT & CONTROL TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap