Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

A Slope Conversion Circuit Applied to Two-step Integral Analog-to-Digital Converter

An analog-to-digital converter and conversion circuit technology, which is applied in the direction of physical parameter compensation/prevention, etc., can solve problems such as gain error, and achieve the effect of eliminating gain error, improving accuracy and speed, and eliminating nonlinear error.

Active Publication Date: 2017-02-01
FUDAN UNIV
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Aiming at the problems existing in the prior art of the above-mentioned two-step single-slope single-slope integral analog-to-digital converter, the present invention provides a slope conversion circuit to solve the problem of the first In the process of switching from the first step to the second step and the voltage change caused by the second step operation to the output of the slope conversion circuit, the problem of gain error due to parasitic capacitance

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Slope Conversion Circuit Applied to Two-step Integral Analog-to-Digital Converter
  • A Slope Conversion Circuit Applied to Two-step Integral Analog-to-Digital Converter
  • A Slope Conversion Circuit Applied to Two-step Integral Analog-to-Digital Converter

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] For ease of understanding, the present invention will be described in detail below in conjunction with specific drawings and embodiments. It should be pointed out that, image 3 with Figure 5 It is only an example of the implementation of the present invention, and the form and details of the specific implementation within the scope of the claims of the present invention are not limited to image 3 with Figure 5 . For any person who is familiar with integrated circuit design technology, it can be known that the present invention image 3 with Figure 5 Various modifications and changes can be made within the scope of the present invention based on the description herein, and these corrections and changes are also included in the scope of the present invention.

[0023] figure 1 It is a schematic circuit diagram of a known two-step integral analog-to-digital converter, including: a traditional ramp conversion circuit 101 , a comparator 102 , a latch and adder 103...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the technical field of semiconductors and integrated circuits, and in particular relates to a slope conversion circuit applied to a two-step type integral analog-to-digital converter. The slope conversion circuit comprises an operational amplifier, a pair of sampling capacitors, a pair of parasitic balance capacitors and six switches. During high-level analog-to-digital conversion in the first step, an input slope signal is directly output, and is sampled and held by the operational amplifier and the first sampling capacitor; during low-level analog-to-digital conversion in the second step, the input slope signal is input to the positive input end of the operational amplifier, the operational amplifier transfers the voltage change of the positive input end to a floating pole plate of the second sampling capacitor in a mode that the gain is 1, and the voltage is superposed to the holding voltage in the first step and serves as the output of the slope conversion circuit. According to the slope conversion circuit, gain errors caused by parasitic capacitors in a process of transferring the voltage change of the two-step type integral analog-to-digital converter can be effectively eliminated, and the accuracy and the speed are improved.

Description

technical field [0001] The invention belongs to the technical field of semiconductors and integrated circuits, and in particular relates to a slope conversion circuit applied to a two-step integral analog-to-digital converter in an integrated circuit. Background technique [0002] Due to its simple structure, low power consumption, and high precision, the integral analog-to-digital converter has very obvious advantages in the low-speed field, especially in the application of multi-channel parallel analog-to-digital converters, the integral analog-to-digital converter is even more Widely used for its excellent channel-to-channel consistency. But the conversion time of the traditional B-bit integrating ADC is 2 B clock cycle, this shortcoming limits the improvement of its accuracy. Therefore, the integral analog-to-digital converter changes from the traditional one-step structure to the two-step structure, and the relationship between conversion time and accuracy is changed ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H03M1/06
Inventor 程旭孙彪郭东东曾晓洋
Owner FUDAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products