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Testing data compressing and decompressing method on basis of double-run-length alternate coding

A technology of test data and alternate encoding, which is applied in the direction of code conversion and electrical components, and can solve problems such as low compression efficiency, small decoding circuit overhead, and long decoding time

Inactive Publication Date: 2014-04-23
ANQING NORMAL UNIV
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Problems solved by technology

Run-length-based coding schemes have higher data compression rate and lower decoding circuit overhead. Golomb coding, FDR coding, and AFR coding are all run-length-based coding schemes, but the above-mentioned schemes still have low compression efficiency and complex coding. , long decoding time and high testing cost

Method used

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  • Testing data compressing and decompressing method on basis of double-run-length alternate coding
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  • Testing data compressing and decompressing method on basis of double-run-length alternate coding

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Embodiment Construction

[0034] The present invention will be further described below in conjunction with the accompanying drawings.

[0035] The test data compression and decompression method based on double-run alternate coding of the present invention comprises the following steps:

[0036] A. Build a code table;

[0037] Such as figure 1 It can be seen that the code table includes the following fields: the group number represented by k, the run length represented by L, the group prefix, the group suffix, the run length code word formed by the combination of the group prefix and the group suffix, the record in the code table Arranged and grouped in ascending order according to the run length L, and the group number k is sorted in ascending order.

[0038] The group number k is a decimal number starting from 1, and the run length L is a decimal number starting from 1; the group prefix and group suffix are expressed as binary strings.

[0039] When k=1, the kth group includes two records: if L=1, ...

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Abstract

The invention discloses a testing data compressing and decompressing method on the basis of double-run-length alternate coding, which is on the basis of an FDR (False Discovery Rate) code and is a variable-to-variable-length compressing method. According to the condition that besides a great number of 0 run lengths, a great number of 1 run lengths exist in a test set, a method of alternately coding 0 / 1 run lengths is disclosed, and the next run length type can be obtained according to conversion of the previous run length type, so that the run length types do not need to be expressed in code words and the length of the code words required by the run lengths is reduced, and thus, the compression ratio is improved. Meanwhile, a decoding circuit in the method is simple and is independent of a tested circuit. Therefore the method has good application prospect.

Description

technical field [0001] The invention relates to an integrated circuit test method, in particular to a system chip test data compression and decompression method. Background technique [0002] With the improvement of the technology level, the number of transistors integrated on the system chip SOC (System-on-a-chip) increases sharply. At the same time, in order to speed up the SoC design process, the design technology of IP (Intellectual Property) core multiplexing is usually widely used. In order to ensure that the product is free from defects, it is necessary to test the chip. At present, SoC testing is facing more and more difficulties, and the large amount of test data is one of the current difficulties. In order to cope with the pressure of the rapid growth of test data, it is generally effective to use compression technology to compress the test data. The test data compression technique first converts the test set T D Encode according to a certain encoding method, an...

Claims

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Application Information

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IPC IPC(8): H03M7/40
Inventor 程一飞詹文法吴琼吴海峰朱世娟何姗姗黄丽暴阳
Owner ANQING NORMAL UNIV
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