Method for designing terahertz quantum well photoelectric detector

A technology of photodetector and design method, which is applied in the direction of circuits, electrical components, semiconductor devices, etc., can solve the problems of reduced coupling efficiency and unsuitable grating height, and achieve the effect of improving performance

Active Publication Date: 2014-06-25
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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Problems solved by technology

[0005] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a design method for a terahertz quantum well photodetector, which is used to solve the problem of the terahertz quantum well photodetector in the prior art due to the unsuitability of the grating height. Problems leading to reduced coupling efficiency

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[0031] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0032] see Figure 5 ~ Figure 8 . It should be noted that the diagrams provided in this embodiment are only schematically illustrating the basic idea of ​​the present invention, and only the components related to the present invention are shown in the diagrams rather than the number, shape and shape of the components in actual implementation. Dimensional drawing, the type, quantity and proportion of each component can be changed arbi...

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Abstract

The invention provides a method for designing a terahertz quantum well photoelectric detector. The method comprises the steps that (1) according to wave length lambda p of peak response frequency of the terahertz quantum well photoelectric detector in device materials, a period P of an etching grating is designed to enable P equals to the lambda p; (2) electromagnetic field distribution inside the terahertz quantum well photoelectric detector under irradiation of incident light is calculated; (3) components which contribute to intersubband transition in the electromagnetic field distribution are extracted, integration is carried out on energy of the components in an active area, and the total energy It which contributes to the intersubband transition in the active area is obtained; (4) different grating heights h are set, the total energy It under the different grating heights h is calculated, and the grating height h when the total energy It is maximum is selected at the height of the etching grating. The method can effectively improve the performance of the terahertz quantum well photoelectric detector at the peak response frequency point, and has important significance on achievement and imaging application of high-performance terahertz quantum well photoelectric detectors.

Description

technical field [0001] The invention belongs to the technical field of semiconductor optoelectronic devices, in particular to a design method of a terahertz quantum well photodetector. Background technique [0002] Terahertz (THz) detectors are key devices for various THz research and various THz application systems. THz quantum well photodetectors (QWPs) are widely considered to be one of the most promising THz detectors due to their small size, easy integration, and fast response. [0003] From the working principle, THz QWP is an inter-subband transition (ISBT) detector. However, due to the limitation of quantum mechanics, if the incident light is irradiated vertically on the THz QWP surface, ISBT will not occur, and thus no photocurrent will be generated. Therefore, the usual practice is to obliquely incident light into the device, such as along the direction of the Brewster angle on the surface of the QWP, or grind the end face of the QWP to an angle of 45 degrees, an...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/18
CPCH01L31/02327Y02P70/50
Inventor 张戎曹俊诚郭旭光顾亮亮
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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