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Multi-board data synchronous sampling system

A data synchronization and sampling system technology, applied in the direction of comprehensive factory control, electrical program control, comprehensive factory control, etc., can solve the problems of increasing the cost of control circuits, increasing the latch signal bus, and poor system compatibility, so as to reduce the cost of control circuits , strong controllability and strong compatibility

Inactive Publication Date: 2014-07-09
HUAZHONG UNIV OF SCI & TECH
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Problems solved by technology

[0005] The present invention aims to solve the defects and deficiencies such as the need to add a dedicated latch signal bus, increase the cost of the control circuit, and poor system compatibility in the multi-board data synchronous sampling system of the prior art, and provide a multi-board The card data synchronous sampling system, through the specific synchronous sampling clock control signal, controls the synchronous acquisition and update data of each board card, and controls the alternate process of data acquisition of each board card and bus data acquisition, and realizes the nanosecond level of data acquisition of each board card Synchronous, and does not need to increase the bus width, low cost, strong compatibility, especially suitable for synchronous data acquisition of multiple laser counting cards of high-precision high-speed multi-axis processing equipment

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Embodiment Construction

[0018] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0019] figure 1 It is an overall architecture diagram of the multi-board data synchronous sampling system of the present invention, including a data acquisition card, a bus, a sampling clock signal line, and more than two measurement boards. The measurement boards can be laser counting cards or other types of counting cards . The data acquisition card and each measurement board are connected to the same bus, and the data acquisition card can collect the data collected by each measurement board through the bus. A sampling signal line is also connected between the data acquisition card and each mea...

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Abstract

The invention discloses a multi-board data synchronous sampling system. The multi-board data synchronous sampling system comprises a data acquisition card, a bus, a sampled signal line and two or more measuring boards, wherein the data acquisition card comprises a sampled signal control module composed of a clock generator, a control signal generator, a bus controller and an and gate; when control signals output high electrical levels, the control signals and clock signals pass through the and gate to form sampled signals used for controlling each measuring board to synchronously acquire data and control the data acquisition card to stop bus data acquisition; when the control signals output low electric levels, the control signals and the clock signals pass through the and gate to form the sampled signals used for controlling each measuring board to synchronously stop acquiring data and controlling the data acquisition card to conduct bus data acquisition. The multi-board data synchronous sampling system can achieve nanosecond-level synchronization of data acquisition of the boards, does not need to increase the width of the bus, and is particularly suitable for synchronous data acquisition of a plurality of laser counter cards of high-accuracy high-speed multi-shaft machining equipment.

Description

technical field [0001] The invention relates to a multi-board data synchronous sampling system, in particular to a nanosecond-level synchronous sampling system for multi-board data acquisition for multi-axis laser position measurement in a high-precision machining process, belonging to the technical field of automatic control. Background technique [0002] In the field of precision testing, laser heterodyne interferometry has been widely used due to its advantages such as fast response speed, large measurement range, high signal-to-noise ratio, ability to overcome direction ambiguity, and not be affected by changes in light intensity. In high-precision multi-axis processing equipment such as IC, it is often necessary to simultaneously collect data from multiple axis laser counting cards. The precision of these processing equipment needs to reach the nanosecond level, and the movement speed of the workpiece table can reach several meters per second. Considering that the posit...

Claims

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Application Information

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IPC IPC(8): G05B19/418
CPCY02P90/02
Inventor 周柔刚周云飞涂骁刘广斗纪善昌汪松严思杰
Owner HUAZHONG UNIV OF SCI & TECH
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