A field emission electron source emitter tip shaping device and its shaping method
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- PEKING UNIV
- Publication Date
- 2017-01-04
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Abstract
Description
technical field
[0001] The invention relates to a field emission electron source, in particular to a field emission electron source emitter tip shaping device and a shaping method thereof. Background technique
[0002] As an important tool for human beings to explore the microcosm, the field emission electron microscope is widely used in many fields such as material science, life science, semiconductor industry, geology, energy, medical treatment, and pharmaceuticals with its unique high-resolution and analytical performance. It plays a huge role in scientific research and industrial production.
[0003] The field emission electron source is one of the core components of the field emission electron microscope. Its performance determines the main electron optical performance parameters in the field emission electron microscope, which includes the emission angular current density of the electron gun, the total emission beam current of the electron beam, and the energy dispersi...