Two-way board-level radio frequency magnetic field probe
A magnetic field probe, radio frequency technology, applied in the direction of electromagnetic field characteristics, etc., can solve the problem of position repeatability limitation, unable to guarantee space measurement points, etc., to achieve the effect of accurate measurement
Active Publication Date: 2014-09-24
FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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Problems solved by technology
That is, the second scan is often not guaranteed to repeat the spatial measurement points of the first scan
The shortcoming of prior art is: board-level RF current probe can only usually measure the component of an electromagnetic field (Hx, Hy, Hz, Ex, Ey, Ez); The probe requires two scans to obtain the two components of the electromagnetic field; the unidirectional electromagnetic field probe scans twice to obtain the two components of the electromagnetic field. This method is limited by the position repeatability of the mobile platform
Method used
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Embodiment Construction
[0030] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.
[0031] A two-way board-level radio frequency magnetic field probe, the design principle is as follows: the radio frequency magnetic field can produce a change in magnetic flux in the coil (Loop) formed by the wire, and according to the Faraday effect, a radio frequency current is formed inside the coil formed by the wire, or it can be connected to the coil formed by the wire. The terminal forms a radio frequency voltage; by measuring these radio frequency currents or radio frequency voltages, the magnitude of the radio frequency magnetic field at the position of the coil can be deduced. In order to realize simultaneous detection of radio frequency magnetic fields in two directions, a wire loop coil with two directions perpendicular to each other can be fabricated.
[0032] Such as Figure 1 to Figure 11 As shown, the two-way board-level radio frequenc...
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The invention discloses a two-way board-level radio frequency magnetic field probe. The two-way board-level radio frequency magnetic field probe comprises a probe body, a first measurement circuit, a second measurement circuit, a first signal output end and a second signal output end. The first measurement circuit and the second measurement circuit are perpendicular to each other in the probe body. The first signal output end is connected with the first measurement circuit. The second signal output end is connected with the second measurement circuit. The first signal output end and the second signal output end are arranged in a staggered mode in the probe body. The first measurement circuit and the second measurement circuit respectively comprise a signal line and a signal shielding line which are connected to form a loop. According to the probe which is designed in a two-way mode, two independent probes in different loop directions are integrated, one of the loops is obtained through a printed circuit board method, the other loop is obtained through the through hole technology, and the comprehensive electromagnetic field information can be obtained through one-time probe scanning by combining with a measurement instrument.
Description
technical field [0001] The invention relates to the technical field of electromagnetic field measurement, in particular to a bidirectional board-level radio frequency magnetic field probe. Background technique [0002] With the gradual increase in chip density and operating frequency of current integrated circuits, EMI electromagnetic interference noise at the integrated circuit and PCB board level has become more and more serious in electronic products. In order to suppress these interference noises and evaluate the level of electromagnetic interference noise generated by integrated circuits, it is very important to measure the electromagnetic interference noise on the surface of integrated circuits and the local near-field of PCB boards. This measurement is usually done using a near-field scanning method. [0003] In order to fully understand and measure the distribution of the electromagnetic field on the surface of the integrated circuit and the local near field of the ...
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IPC IPC(8): G01R29/08
Inventor 方文啸陈立辉恩云飞史春蕾刘远肖庆中
Owner FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH