FPGA (Field Programmable Gata Array) based high-cycle fatigue testing machine controller
Patent Information
- Authority / Receiving Office
- CN Β· China
- Current Assignee / Owner
- SHANGHAI UNIV
- Publication Date
- 2014-12-10
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Abstract
Description
technical field
[0001] The present invention relates to a high-frequency fatigue testing machine controller based on FPGA. On the basis of the traditional testing machine controller, through the combination of FPGA technology and microcomputer technology, the performance of the controller system is comprehensively improved, so that the whole The work efficiency, control precision and electrical system reliability of the machine have been improved, and the operation is convenient without lack of advanced technology. Background technique
[0002] The high-frequency fatigue testing machine is a machine mainly used to test the fatigue performance of metals and their alloy materials under room temperature in tension, compression or tension and compression alternating loads. Its characteristic is that it can realize high load, high frequency, and low power consumption, thereby shortening the test time and reducing the test cost. It is one of the main test equipment for my country'...