FPGA (Field Programmable Gata Array) based high-cycle fatigue testing machine controller

A fatigue testing machine and controller technology, applied in computer control, program control, general control system, etc., can solve problems such as low control accuracy, cumbersome operation, and poor system stability, so as to enhance anti-interference and improve control accuracy , The effect of simplifying debugging

Active Publication Date: 2014-12-10
SHANGHAI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The traditional high-frequency fatigue testing machine controller mainly uses the optical amplification mechanism to directly measure the force or width, and a large number of discrete components are used inside, which brings problems such as: the rea

Method used

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  • FPGA (Field Programmable Gata Array) based high-cycle fatigue testing machine controller
  • FPGA (Field Programmable Gata Array) based high-cycle fatigue testing machine controller
  • FPGA (Field Programmable Gata Array) based high-cycle fatigue testing machine controller

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0029] Example one:

[0030] See figure 1 , This FPGA-based high-frequency fatigue test machine controller. Including an FPGA central processing module (1), an AD module (2), a DA module (3), a PWM module (4), a photoelectric coding pulse counting module (5), a serial port module (6), an Ethernet Network communication module (7), a storage module (8) and a power supply module (9).

Example Embodiment

[0031] Embodiment 2: This embodiment is basically the same as Embodiment 1, and the features are as follows:

[0032] figure 2 Shows the AD module (2): analog signals AI2+, AI2- enter a common mode filter (11), the two output ends of the filter are respectively connected to a capacitor C1 (13) through two resistors (12, 14) One end of the capacitor C1 (13) is connected to a capacitor C2 (16) to ground, the other end of the capacitor C1 (13) is connected to a capacitor C3 (15) to ground, and the signal at both ends of the capacitor C1 (13) is connected to a voltage amplifier chip (21) 2 and 3 pins. The voltage amplifying chip (21) 1 pin and 8 pin are connected through a resistor, 4 pin is connected to capacitor C4 (19) to ground, 4 pin is connected to an inductance coil (20) is connected to -12v voltage, 4 pin Connect the 4 pins of a voltage regulation chip (25), the 5 pins of the voltage amplification chip (21) and the 6 pins of the voltage regulation chip (25), the 7 pins of t...

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Abstract

The invention relates to an FPGA (Field Programmable Gata Array) based high-cycle fatigue testing machine controller. The FPGA based high-cycle fatigue testing machine controller comprises an FPGA central processing module; the FPGA central processing module is connected with an AD (Analogue-Digital) collection module, a DA (Digital-Analogue) module, a PWM (Pulse Width Modulation) module, a photoelectric coding pulse counting module, a serial port module, an Ethernet communication module, a storage module and a power source module. The FPGA high-cycle fatigue testing machine controller has the advantages completely improving the controller system performance, improving the integral working efficiency, the control accuracy and the electrical system reliability and being convenient to operate and advanced in technology due to combination of the FPGA technology and the personal computer technology based on a traditional testing machine controller.

Description

technical field [0001] The present invention relates to a high-frequency fatigue testing machine controller based on FPGA. On the basis of the traditional testing machine controller, through the combination of FPGA technology and microcomputer technology, the performance of the controller system is comprehensively improved, so that the whole The work efficiency, control precision and electrical system reliability of the machine have been improved, and the operation is convenient without lack of advanced technology. Background technique [0002] The high-frequency fatigue testing machine is a machine mainly used to test the fatigue performance of metals and their alloy materials under room temperature in tension, compression or tension and compression alternating loads. Its characteristic is that it can realize high load, high frequency, and low power consumption, thereby shortening the test time and reducing the test cost. It is one of the main test equipment for my country'...

Claims

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Application Information

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IPC IPC(8): G05B19/042G01N3/02
Inventor 苗中华李闯陆鸣超胡晓东周广兴王胜军
Owner SHANGHAI UNIV
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