Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

FPGA (Field Programmable Gata Array) based high-cycle fatigue testing machine controller

A fatigue testing machine and controller technology, applied in computer control, program control, general control system, etc., can solve problems such as low control accuracy, cumbersome operation, and poor system stability, so as to enhance anti-interference and improve control accuracy , The effect of simplifying debugging

Active Publication Date: 2014-12-10
SHANGHAI UNIV
View PDF6 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The traditional high-frequency fatigue testing machine controller mainly uses the optical amplification mechanism to directly measure the force or width, and a large number of discrete components are used inside, which brings problems such as: the reading is inconvenient; the structure is relatively complicated, and the control accuracy is not high; due to the use of A large number of discrete components, poor system stability, susceptible to external interference; relatively cumbersome operation

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • FPGA (Field Programmable Gata Array) based high-cycle fatigue testing machine controller
  • FPGA (Field Programmable Gata Array) based high-cycle fatigue testing machine controller
  • FPGA (Field Programmable Gata Array) based high-cycle fatigue testing machine controller

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0030] see figure 1 , This FPGA-based high-frequency fatigue test machine controller. Including an FPGA central processing module (1), an AD module (2), a DA module (3), a PWM module (4), a photoelectric code pulse counting module (5), a serial port module (6), an Ethernet network communication module (7), a storage module (8) and a power supply module (9).

Embodiment 2

[0031] Embodiment two: the present embodiment is basically the same as embodiment one, and the features are as follows:

[0032] figure 2 The AD module (2) is shown: the analog signals AI2+, AI2- enter a common mode filter (11), and the two output ends of the filter are respectively connected to a capacitor C1 (13) through two resistors (12, 14). One end of the capacitor C1 (13) is connected to a capacitor C2 (16) for grounding, the other end of the capacitor C1 (13) is connected to a capacitor C3 (15) for grounding, and the signal at both ends of the capacitor C1 (13) is connected to a voltage amplifier chip (21) pins 2 and 3. The 1 pin of the voltage amplifier chip (21) is connected to the 8 pin through a resistor, the 4 pin is connected to the capacitor C4 (19) and grounded, the 4 pin is connected to an inductance coil (20) connected to the -12v voltage, and the 4 pin Connect the 4 pins of a voltage regulation chip (25), the 5 pins of the voltage amplifying chip (21) to ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an FPGA (Field Programmable Gata Array) based high-cycle fatigue testing machine controller. The FPGA based high-cycle fatigue testing machine controller comprises an FPGA central processing module; the FPGA central processing module is connected with an AD (Analogue-Digital) collection module, a DA (Digital-Analogue) module, a PWM (Pulse Width Modulation) module, a photoelectric coding pulse counting module, a serial port module, an Ethernet communication module, a storage module and a power source module. The FPGA high-cycle fatigue testing machine controller has the advantages completely improving the controller system performance, improving the integral working efficiency, the control accuracy and the electrical system reliability and being convenient to operate and advanced in technology due to combination of the FPGA technology and the personal computer technology based on a traditional testing machine controller.

Description

technical field [0001] The present invention relates to a high-frequency fatigue testing machine controller based on FPGA. On the basis of the traditional testing machine controller, through the combination of FPGA technology and microcomputer technology, the performance of the controller system is comprehensively improved, so that the whole The work efficiency, control precision and electrical system reliability of the machine have been improved, and the operation is convenient without lack of advanced technology. Background technique [0002] The high-frequency fatigue testing machine is a machine mainly used to test the fatigue performance of metals and their alloy materials under room temperature in tension, compression or tension and compression alternating loads. Its characteristic is that it can realize high load, high frequency, and low power consumption, thereby shortening the test time and reducing the test cost. It is one of the main test equipment for my country'...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G05B19/042G01N3/02
Inventor 苗中华李闯陆鸣超胡晓东周广兴王胜军
Owner SHANGHAI UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products