An FPGA-based device and method for on-orbit correction of temperature drift in delay chains

Abstract

An FPGA-based on-orbit correction device and method for temperature drift of a delay chain, the device includes a temperature sensor for collecting real-time temperature; a delay chain for reading time information of an input signal relative to a clock edge; The D flip-flop array is connected with the delay chain, and is used to latch the output state of each delay unit in the delay chain when the clock edge arrives, and output thermometer code data; a decoding unit and the D trigger Connected to the device array, used to convert the thermometer code data into binary code data and output it; a lookup table storage unit, used to store the integral non-linear lookup table data of the delay chain calibrated at the preset temperature point; a The temperature drift correction control unit is respectively connected with the temperature sensor, the decoding unit and the look-up table storage unit to realize on-orbit real-time correction of the delay chain temperature drift. The invention adopts less resources to realize the temperature drift correction of the delay time of the delay chain, and ensures higher time resolution capability.

Description

technical field [0001] The invention relates to the fields of aerospace and semiconductor technologies, in particular to an FPGA-based on-orbit correction device and method for temperature drift of a delay chain. Background technique [0002] With the rapid development of aerospace and semiconductor technology in recent years, more and more semiconductor integrated devices have been applied in space missions. In many space applications, high-precision time-resolution capabilities of semiconductor devices are required, such as satellite altimeters, space range finders, space telemetry, time calibration, time calibration in space quantum communications, space high-energy particle spectrometers and plasma Time-of-flight measurement systems for spectrometers, and a series of high-precision time-measurement measurement systems. Usually, a semiconductor device can use multiple delay units to be cascaded to realize the interpolation of the main clock cycle of the device to achieve...

AI Technical Summary

Problems solved by technology

However, the patent proposes to use a linear function to fit the temperature drift of the delay unit, which can only be applied to a small operating temperature range

When the temperature change range is large, the conformity of the linear function to the temperature change curve will be reduced, and the accuracy of the linear function method will be correspondingly reduced.

At the same time, the patent describes the process of offline correction of temperature drift, but does not provide a method for real-time correction of temperature drift in FPGA, and its application in the space environment has certain limitations.

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