Composition, pattern forming method, and manufacturing methods of crystal particles and display device
A composition and pattern technology, applied in photosensitive resin composition and its application field, can solve the problems of insufficiency of evaporation and poor peeling property, etc.
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Embodiment 1
[0135] 40 parts by weight of novolak resin A-1-1, 60 parts by weight of novolac resin A-2-1, 0.1 parts by weight of 2,4-bis(trichloromethyl)-6-p-methoxy Styryl-s-triazine, 0.1 parts by weight of tripentylamine (tripentylamine), and 5 parts by weight of CYMEL303 were added to 100 parts by weight of propylene glycol monomethyl ether acetate (PGMEA), and shaken After stirring evenly with a shaking type stirrer, the negative photosensitive resin composition of Example 1 can be prepared.
[0136]The negative photosensitive resin composition of Example 1 above was coated on a glass substrate by spin coating to form a coating film. Next, the coating film was pre-baked at 100° C. for 90 seconds to form a photoresist film with a thickness of about 3.4 μm. Then, utilize 80mJ / cm2 ultraviolet light to carry out pattern exposure to photoresist film (exposure machine model is AG500-4N, manufactured by M&R Nanotechnology (M&R Nanotechnology); ) photomask (manufactured by NIPPON FILCON). Th...
Embodiment 2
[0138] -Example 2 to Example 10-
[0139] The negative photosensitive resin composition and the photoresist pattern of embodiment 2 to embodiment 10 are prepared with the same steps as embodiment 1, and its difference lies in: changing the type and usage amount of ingredients (as shown in table 3 shown), wherein the compounds corresponding to the labels in Table 3 are shown in Table 2. In addition, the peelability of the photoresist pattern formed by the negative photosensitive resin composition and the degree of resistance to the vapor deposition process were evaluated, and the results are shown in Table 3.
[0140] Table 2
[0141]
[0142]
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