Device and method for testing microwave surface resistance distribution of high-temperature superconducting thin film
A technology of microwave surface resistance and high-temperature superconducting thin film, which is applied in the field of superconducting electronics, can solve the problems of resolution, sensitivity and versatility, and achieve high test resolution and sensitivity, reduce difficulty, and high test accuracy Effect
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[0039] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific examples.
[0040] The high-temperature superconducting thin film microwave surface resistance distribution test device provided in this embodiment includes a test seat 1 , a fixing component, a calibration component and a sealing cover 5 .
[0041] The schematic diagram of the test socket 1 is as follows: figure 2 As shown, it includes a shielding case 6 , an input coupling structure 8 , an output coupling structure 9 , a support ring 10 , a dielectric post 11 and a metal ring 12 . The dielectric column 11 is fixed on the support ring 10 and then fixed in the shielding shell 6. The metal ring 12 is embedded on the inner wall of the shielding shell 6. The thickness of the metal ring 12 ranges from 0.1mm to 0.5mm, and its inner diameter is slightly larger than The diameter of the me...
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