Device and method for testing microwave surface resistance distribution of high-temperature superconducting thin film

A technology of microwave surface resistance and high-temperature superconducting thin film, which is applied in the field of superconducting electronics, can solve the problems of resolution, sensitivity and versatility, and achieve high test resolution and sensitivity, reduce difficulty, and high test accuracy Effect

Active Publication Date: 2015-01-28
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
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Problems solved by technology

[0007] The purpose of the present invention is to solve the problem that the resolution, sensitivity and versatility of the existing superconducting thin film microwave surface resistance distribution test method cannot be ba

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  • Device and method for testing microwave surface resistance distribution of high-temperature superconducting thin film
  • Device and method for testing microwave surface resistance distribution of high-temperature superconducting thin film
  • Device and method for testing microwave surface resistance distribution of high-temperature superconducting thin film

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Embodiment Construction

[0039] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific examples.

[0040] The high-temperature superconducting thin film microwave surface resistance distribution test device provided in this embodiment includes a test seat 1 , a fixing component, a calibration component and a sealing cover 5 .

[0041] The schematic diagram of the test socket 1 is as follows: figure 2 As shown, it includes a shielding case 6 , an input coupling structure 8 , an output coupling structure 9 , a support ring 10 , a dielectric post 11 and a metal ring 12 . The dielectric column 11 is fixed on the support ring 10 and then fixed in the shielding shell 6. The metal ring 12 is embedded on the inner wall of the shielding shell 6. The thickness of the metal ring 12 ranges from 0.1mm to 0.5mm, and its inner diameter is slightly larger than The diameter of the me...

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Abstract

The invention discloses a device and method for testing the microwave surface resistance distribution of a high-temperature superconducting thin film. The testing device comprises a testing seat, a fixing assembly, a calibration assembly and a sealing cover, and the working resonant mode is TE012. The testing seat comprises a shielding shell, an input coupling structure, an output coupling structure, a supporting ring, a dielectric cylinder and a metal circular ring. The testing seat is loaded with the tested superconducting thin film to constitute a resonator. The fixing assembly is used for fixing the tested superconducting thin film, and the sealing cover is used for isolating the inside and the outside of the resonator. The device and method for testing the microwave surface resistance distribution of the high-temperature superconducting thin film have the advantages that the contradiction among the resolution ratio, the sensitivity and the universality of the testing device in the microwave surface resistance distribution test of the superconducting thin film is solved; the tested superconducting thin film can be effectively prevented from being pressed to be damaged; direct coupling can be effectively avoided, and high testing precision is achieved.

Description

technical field [0001] The invention belongs to the technical field of superconducting electronics, and in particular relates to the design of a high-temperature superconducting film microwave surface resistance distribution testing device and method. Background technique [0002] The microwave surface resistance of high-temperature superconducting films in the liquid nitrogen temperature zone is 2-3 orders of magnitude lower than that of conventional good conductors. This low-loss characteristic makes high-temperature superconducting microwave passive devices based on high-temperature superconducting films have Excellent characteristics that cannot be compared with conventional devices. According to the structural characteristics of the high-temperature superconducting film itself, its microwave surface resistance is not uniform. As the circuit of superconducting devices becomes more and more complex, the consistency of superconducting film materials becomes increasingly pr...

Claims

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Application Information

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IPC IPC(8): G01R27/02
Inventor 曾成补世荣宁俊松陈柳张其劭
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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