Al2O3/SiON inactivation layer structure of LED (light emitting diode) chip and growth method thereof
A technology of LED chip and growth method, which is applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve the problems of low density of passivation layer materials, small pinhole density, etc., achieve good compactness and reduce leakage , the effect of high crystal quality
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0033] The specific embodiment of the present invention will be described in further detail below in conjunction with the accompanying drawings. The LP-MOCVD used in the examples is a self-made MOCVD equipment dedicated to growing oxide materials, and the model is SCMD-600B. The plasma-enhanced chemical vapor deposition PECVD used is commercially available The model sold is Plasmalab800Plus.
[0034] Such as figure 1 and figure 2 As shown, the Al of a kind of LED chip provided by the present invention 2 o 3 / SiON passivation layer structure, including pattern substrate 1, GaN-based epitaxial layer, ITO conductive film 5, P electrode 8, N electrode 9 and Al 2 o 3 / SiON composite layer 10, wherein the GaN-based epitaxial layer includes N-GaN2, quantum well MQW light-emitting layer 3 and P-GaN4, Al 2 o 3 / SiON composite layer 10 comprising Al 2 o 3 Passivation film 6 and SiON anti-reflection film 7. The manufacturing method of the above-mentioned embodiment is as follows:...
PUM
![No PUM](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com