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Particle granularity and concentration light scattering measuring method

A technology of light scattering measurement and particle concentration, which is applied in the direction of transmittance measurement, measurement device, particle size analysis, etc., and can solve the problems of stray light affecting measurement accuracy and other issues

Active Publication Date: 2015-04-15
NANJING INST OF MEASUREMENT & TESTING TECH
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  • Abstract
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AI Technical Summary

Problems solved by technology

In actual engineering measurement, particles adhere to the optical window of the measurement area, causing a large amount of stray light to affect the measurement accuracy

Method used

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  • Particle granularity and concentration light scattering measuring method
  • Particle granularity and concentration light scattering measuring method
  • Particle granularity and concentration light scattering measuring method

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Embodiment Construction

[0040] The present invention will be further described below in conjunction with the accompanying drawings.

[0041] Such as figure 1 As shown, the laser emitted by the laser and the spatial filter 1 filters the non-parallel stray light in the laser beam, and the diffused beam passes through the collimator lens 2 to form a beam of parallel light. The parallel beam passes through the dust-containing gas-solid two-phase mixed fluid 3, and the parallel beam passes through the solid particles in the fluid to generate scattered light and transmitted light. After passing through the collecting lens 4, the scattered light and transmitted light are focused on the focal plane of the collecting lens 4, the focal plane Place multi-component optical fiber distribution plate 5 on it. The optical signal collected by the optical fiber distribution board 5 is transmitted to the photoelectric conversion system 6 through the optical fiber, and converted into a current signal. The current signa...

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Abstract

The invention discloses a particle granularity light scattering measurement method. The method comprises the following steps: 1, measuring light intensity change values I delta t sigma (theta 1) = It + delta t sigma (theta 1)-It sigma(theta 1), I delta t sigma (theta 2) = It + delta t sigma (theta 2)-It sigma (theta 2); 2, measuring particle size distribution by substituting the light intensity change values of the two scattering angles into the following formula to obtain a particle size distribution function; and 3, measuring the average particle size by substituting the light intensity change values of the two scattering angles I delta sigma (theta 1) and I delta sigma (theta 2) into the formula below to obtain the average particle size D30. The particle granularity and concentration light scattering measuring method provided by the invention has the advantages of simple measurement process, easy calibration, and no requirement on knowing any parameter; and a twice measurement method is provided to avoid the influence of window pollution in particle size distribution solving on the measurement results.

Description

technical field [0001] The invention relates to a particle size and concentration light scattering measurement method, which belongs to the technical field of particle measurement. Background technique [0002] Particle measurement plays an important role in energy research, environmental protection, atmospheric science and other fields. Because of its important position, there are many kinds of particle measurement technologies that have been developed, such as mechanical method, inductive capacitance method, ultrasonic method, optical method Wait. In recent decades, due to the development of laser technology, computer technology and optical fiber technology, optical methods have been developed rapidly, including light scattering methods. The basis of light-scattering particle measurement is the Mie scattering theory, which is a rigorous physical understanding of the scattering of electromagnetic waves by spherical particles. [0003] The more mature method of optically m...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/02G01N21/59
CPCG01N15/0211G01N15/06G01N2015/0046G01N15/075
Inventor 林学勇李舒许传龙张宸瑜
Owner NANJING INST OF MEASUREMENT & TESTING TECH
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