A refrigeration structure for variable temperature testing of integrated Dewar components
An integrated technology of Dewar components, applied in temperature control, measuring instrument components, non-electric variable control, etc., to achieve the effects of easy installation and disassembly, stable results, and high test accuracy
Active Publication Date: 2016-05-18
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology
[0004] The purpose of the present invention is to provide a refrigeration structure for the internal variable temperature test of the integrated Dewar assembly, which solves the problem of non-interference testing of the detector performance during the coupling packaging process of the detector and the refrigerator and shortens the packaging cycle, and satisfies the performance of the detector in the package. In-process performance control requirements
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[0048] The specific embodiment of the present invention is described in further detail below in conjunction with accompanying drawing:
[0049] The embodiment is a performance test of an ultra-long line infrared detector focal plane integrated Dewar component detector, as attached figure 1 As shown, its main implementation method is as follows:
[0050] 1. In this patent, the preparation method and assembly sequence of the parts and components of the refrigeration structure used for the internal variable temperature test of an integrated Dewar assembly are as follows:
[0051] a) The core column 7 is made of stainless steel 304L material, the wall thickness is 0.15mm, and the outer surface is polished. This part plays the role of liquid nitrogen storage refrigeration and low solid conduction heat leakage. The material of the cold head 10 is high conductivity oxygen-free copper, and the outer surface is polished. The lower end of the core column 7 and the cold head 10 are con...
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The invention discloses a refrigeration structure for a temperature change test of an integrated type Dewar assembly. The structure comprises an epoxy pull rod handle, an epoxy pull rod, a liquid nitrogen cavity sealing cover plate, a shell, a liquid nitrogen storage cavity, a Dewar integrated supporting small end sealing cover plate, a core column, a fixed rod cap, a liquid nitrogen tray, a cold head, a temperature measuring platinum resistor, a lead wire, a lead wire ring, a Dewar integrated supporting sealing bottom plate, a heating resistor and a Dewar integrated supporting large end sealing cover plate. The refrigeration structure and a realization method are simple, the commonality is high and the cost is low; and the invention discloses the refrigeration structure which can be used for achieving a testing temperature being 85-130K by adjusting different distances between a liquid nitrogen surface and a cold platform, and the testing temperature is accurately controlled by heat compensation.
Description
technical field [0001] The present invention relates to the packaging technology of integrated Dewar components, in particular to a refrigeration structure used in the packaging process of integrated ultra-long line infrared focal plane Dewar components for temperature-variable testing of detectors, which is suitable for use of linear pulses Process test of detector performance in tube refrigerator and detector integrated coupled Dewar assembly. Background technique [0002] With the improvement of requirements for spatial resolution and detector sensitivity, infrared focal plane detectors often adopt the method of splicing detector chip modules in line or array to improve the resolution. For infrared focal plane detectors using this type of splicing method, the requirements for operating temperature and temperature uniformity are high, so the integrated coupling method of Dewar components and linear pulse tubes is often used to meet the cooling requirements of large cooling...
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IPC IPC(8): B01L7/00G01D11/00G05D23/24
Inventor 李俊孙闻王小坤陈俊林曾智江郝振贻李雪
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI