Automatic test system and automatic test method

Abstract

The invention discloses an automatic test system and an automatic test method. The automatic test system comprises a field programmable gate array, a digital-to-analog converter, an analog-to-digital converter, and a processor. The field programmable gate array generates a digital test signal according to a digital signal protocol prewritten therein, and makes a device to be tested generate a digital signal output according to the digital test signal. The field programmable gate array analyzes and compares the digital signal output based on the digital signal protocol, and generates a digital measurement result. The digital-to-analog converter generates an analog test signal, and makes the device to be tested generate an analog output signal according to the analog test signal. The analog-to-digital converter measures the analog output signal to obtain an analog measurement result. The processor receives the digital measurement result and the analog measurement result, and judges whether the function of the device to be tested is normal or not based on the digital measurement result and the analog measurement result. By adopting the automatic test system and the automatic test method of the invention, noise interference in mass production test can be avoided, and the efficiency of automatic test production can be improved.

Description

technical field [0001] The invention relates to an automatic test system, in particular to an automatic test system using a field programmable gate array. Background technique [0002] figure 1 It is a schematic diagram of an automated test system 10 equipped with an analysis instrument 14 to test a device under test 15 . Here, the device under test 15 is an audio integrated circuit, and the analysis instrument 14 is an audio analyzer. The automated test system 10 includes a power supply 11 , a processor 16 , a logic I / O board 12 and a universal interface bus 13 . The automated test system 10 has functions of power supply and digital signal and analog signal measurement. In the automated testing system 10 , the processor 16 is respectively coupled to and controls the power supply 11 , the logic I / O board 12 and the universal interface bus 13 . The logic I / O board 12 can realize the function of a function generator (that is, the logic I / O board 12 can send digital signals...

AI Technical Summary

Problems solved by technology

For example, the communication protocol conforming to the general interface bus 13 stipulates that only a single analytical instrument can be controlled at the same time; or the general interface bus 13 requires command reading time and is limited by its transmission rate

Images