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Uncooled infrared focal plane array heterogeneity correcting method and device

A technology of non-uniformity correction and focal plane array, which can be applied to measurement devices, radiation pyrometry, instruments, etc., and can solve the problem of doubling the number of DACs on a chip

Inactive Publication Date: 2015-06-03
GUANGWEI TECH GRP
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Problems solved by technology

Better correction results can be obtained by using two-point temperature calibration method, but the number of on-chip DACs is doubled

Method used

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  • Uncooled infrared focal plane array heterogeneity correcting method and device
  • Uncooled infrared focal plane array heterogeneity correcting method and device
  • Uncooled infrared focal plane array heterogeneity correcting method and device

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Embodiment Construction

[0032] Embodiments of the invention are described in detail below, examples of which are illustrated in the accompanying drawings. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.

[0033] figure 1 In one embodiment of the present invention, an uncooled infrared focal plane array non-uniformity correction circuit is shown, and the circuit includes an infrared detection part 1 and a non-uniformity correction part 2 . figure 2 for figure 1 A flow chart of the correction method of the correction circuit.

[0034] Such as figure 1 As shown, the infrared detection part 1 is used to detect the infrared radiation naturally emitted by the target object, and convert the received optical signal into an electrical signal for output. The infrared detection part 1 includes N column-level circuits (N is the number of columns of the pixel array), and only two...

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Abstract

The invention provides an uncooled infrared focal plane array heterogeneity correcting method, which comprises the following steps that a, each image element on an uncooled infrared focal plane array is tested twice at two target temperatures, and the output voltage of each image element at the first and second target temperatures is obtained; b, the output voltage of all image elements at the first and second target temperatures is respectively subjected to average value calculation; c, according to the average value, the output voltage difference quantity between the output voltage value of each image element at the first and second target temperatures and the output voltage average value of all image elements at the temperatures are respectively calculated; d, the two output voltage difference quantities, obtained at the first and second target temperatures, of each image element are respectively calculated, and the required voltage regulation quantity of each image element is obtained; e, the required DAC (digital-to-analogue conversion) offset is inquired in a finding table according to the voltage regulating quantity of each image element; f, the output of each image element is corrected according to the DAC offset, and the uniformity correction of the whole array is completed.

Description

technical field [0001] The invention relates to the field of infrared imaging systems, in particular to a method and device for correcting non-uniformity of an uncooled infrared focal plane array. Background technique [0002] Infrared focal plane array belongs to the second-generation infrared imaging device and is the core of modern infrared imaging system. It has the advantages of simple structure, stable operation, low noise and high sensitivity. In an infrared imaging system, under ideal conditions, the infrared focal plane array is irradiated uniformly, and the output amplitudes should be exactly the same. However, due to the non-uniformity of the pixel itself (the non-uniformity of the device caused by the non-uniformity of the semiconductor material for making the device, the influence of mask errors, process conditions, etc.), the external input (such as the bias voltage and bias current of the pixel) Different factors will cause the non-uniformity of the output. ...

Claims

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Application Information

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IPC IPC(8): G01J5/00G01J5/10
Inventor 雷述宇
Owner GUANGWEI TECH GRP
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