A compact electrostatic lens for deflecting and converging ion beams
An electrostatic lens and ion beam technology, which is applied in the field of ion optical systems of mass spectrometers, can solve the problems of installation and positioning difficulties, limit the sensitivity and resolution performance of mass spectrometers, increase the number of high-voltage power supply modules, etc., achieve compact structure, reduce ion transmission loss, and volume small effect
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[0026] A Xe ion beam with an energy of 3KeV passes through the diaphragm 2 with an aperture of 5mm, enters the upper and lower deflection electrode groups with a through hole of 15mm in the third, and produces a convergence effect while deflecting, and finally passes through the shield with an aperture of 15mm. Electrode exits. The deflection voltage is 150V and the convergence potential is -2650V. The ion beam deflection angle is 1.9°, and the focusing plane is located on the detector 3.2m away. Finally, the spot size of the control ion beam is selected to be about 1 mm. The length of the diaphragm, the main lens electrode group and the shielding electrode are all selected at 20mm, and the interval is 2mm. Wherein the upper and lower deflection electrodes of the main lens electrode are separated by 2mm by the three-dimensional positioning insulating component. The entire system requires 2 power modules.
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