Evaluation device for implant damage and fretting damage of neural electrode

Abstract

The invention relates to an evaluation device for implant damage and fretting damage of a neural electrode. The evaluation device comprises a control module, a driving module and a post processing module, wherein the control module and the driving module can finish experimental simulation of the implant process and the fretting state of the neutral electrode by setting different fretting frequencies and wave forms as well as selectable implant parameters; the post processing module is used for calculating the size and the range of tissue damage by a microscopical technique and the digital image correlation theory and comparing the size and the range of the tissue damage with a numerical simulation result. By preparing a soft tissue model of which mechanical properties are close to those of brain tissues, the repeatability of experimental results can be guaranteed, and the problem that the histology experiment is intervened by biological factors is avoided. According to the evaluation device, the verification can be provided for the previous finite element numerical simulation results, the research on mutual action of the neutral electrode and the brain tissues is improved to the experimental stage, design reference is provided for a novel low-damage neutral electrode more effectively, and the long-term service life of the neutral electrode is prolonged.

Description

technical field [0001] The invention relates to the field of medical device testing, in particular to an evaluation device for nerve electrode implantation damage and fretting damage, which is mainly used for evaluating the damage to tissue caused by nerve electrodes during the implantation process and fretting state. Background technique [0002] As a key component connecting nerve tissue and external devices, nerve electrodes have broad application prospects in clinical applications such as epilepsy, Parkinson's disease, spinal cord injury, and other neurological diseases. Currently, the long-term lifespan of neural electrodes is limited due to autoimmune reactions in brain tissue due to acute damage to brain tissue during electrode implantation and micromotion damage from long-term contact with brain tissue after electrode implantation. When the brain tissue immune response is triggered, it will cause fibrous or cellular tissue wrapping on the surface of the electrodes, t...

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Problems solved by technology

However, during the experiment, it was found that histological biological experiments will be affected by a variety of unknown biological factors to cause tissue deformation, and it is not easy to investigate a single factor, resulting in different experimental results for the same electrode parameters

In addition, the test method in this paper can only be aimed at the implantation process. For the micro-motion state of brain tissue, due to the small amplitude (~25μm), the tissue deformation cannot be accurately measured.

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