Semi-transparent dielectric material photo-thermal character measuring system and method

A semi-transparent medium and measurement system technology, which is applied in the field of photothermal characteristic measurement of semi-transparent medium materials, can solve the problem that semi-transparent medium cannot be measured, and achieve the effect of high-efficiency measurement

Inactive Publication Date: 2015-09-02
HARBIN INST OF TECH
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Problems solved by technology

However, due to the particularity of the size and material of translucent media, tradition

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  • Semi-transparent dielectric material photo-thermal character measuring system and method

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[0028] The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings, but are not limited thereto. Any modification or equivalent replacement of the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention shall be included in the present invention. within the scope of protection.

[0029] like figure 1 As shown, the photothermal characteristic measurement system of translucent dielectric materials provided by the present invention consists of a computer 1, a two-dimensional mobile stage 2, a bracket 3, a small off-axis parabolic mirror 4, a collimating mirror 5, an optical fiber 6, a semiconductor laser 7, a large Axial parabolic mirror 8, power line 9, laser power supply 10, HCT thermal detector (HgCdTe, response wavelength 2μm~14μm) 11, BNC data line 12, preamplifier (response frequency 10Hz~1MHz) 13, laser control line 14, T...

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Abstract

The invention discloses a semi-transparent dielectric material photo-thermal character measuring system and method. The measuring system is composed of a computer, a two-dimensional mobile platform, a support, a small off-axis paraboloidal mirror, a collimating lens, an optical fiber, a semiconductor laser, a large off-axis paraboloidal mirror, a power line, a laser power source, an HCT thermal detector, a BNC data line, a pre-amplifier, a laser control line, a phase-lock amplifier, a phase-lock amplifier control line and a data collecting signal line. According to the measuring method, based on the photo-thermal radiation measuring principle, the computer is adopted to control a function generator to generate a modulating signal, the signal controls the laser to enable the light intensity of the laser to change according to a modulating law, after the modulated changed laser is radiated to a sample piece, due to the existence of a photo-thermal effect, the temperature rise and fall and the infrared radiation of the sample piece occur, a photo-thermal radiation signal is correlated to a photo-thermal character parameter of the sample piece, the signal is received by the HCT thermal detector, and then the photo-thermal character parameter of the sample piece is extracted through an arithmetical operation. The semi-transparent dielectric material photo-thermal character measuring system and method can achieve the complete zero damage, non-contact and high-efficiency measurement of materials.

Description

technical field [0001] The invention relates to a system and method for measuring the photothermal characteristics of translucent dielectric materials, which are suitable for measuring the photothermal characteristics of translucent dielectric materials in the fields of aerospace, microelectronics, and thin-layer structures. Background technique [0002] The photothermal physical parameters of the material can quantitatively and objectively evaluate the material performance. Generally, the optical and thermal properties of the material are measured separately by different instruments. The instrument is expensive and the measurement process is cumbersome. , size and other factors limit the scope of use of traditional measurement methods. [0003] Translucent media, such as single crystal diamond, fiber film and other materials, are widely used in various fields of industry due to their good mechanical and thermal properties. However, due to the particularity of the size and ...

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Application Information

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IPC IPC(8): G01N21/63
Inventor 刘俊岩王扬王飞
Owner HARBIN INST OF TECH
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