The invention discloses a semi-transparent
dielectric material photo-thermal character measuring
system and method. The measuring
system is composed of a computer, a two-dimensional mobile platform, a support, a small off-axis paraboloidal mirror, a collimating lens, an
optical fiber, a
semiconductor laser, a large off-axis paraboloidal mirror, a power line, a
laser power source, an HCT thermal
detector, a BNC data line, a pre-
amplifier, a
laser control line, a phase-lock
amplifier, a phase-lock
amplifier control line and a
data collecting signal line. According to the measuring method, based on the photo-
thermal radiation measuring principle, the computer is adopted to control a
function generator to generate a modulating
signal, the
signal controls the laser to enable the
light intensity of the laser to change according to a modulating law, after the modulated changed laser is radiated to a sample piece, due to the existence of a photo-
thermal effect, the temperature rise and fall and the
infrared radiation of the sample piece occur, a photo-
thermal radiation signal is correlated to a photo-thermal character parameter of the sample piece, the signal is received by the HCT thermal
detector, and then the photo-thermal character parameter of the sample piece is extracted through an arithmetical operation. The semi-transparent
dielectric material photo-thermal character measuring
system and method can achieve the complete zero damage, non-contact and high-efficiency measurement of materials.