Minimized high-isolation ceramic packaging structure
A high isolation, ceramic packaging technology, used in semiconductor/solid-state device components, semiconductor devices, electrical components, etc., can solve problems such as high crosstalk and coupling effects in transmission channels, limited wiring space, increased signal loss, etc., to reduce Crosstalk and coupling effect, effect of reducing influence, reducing signal loss
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Embodiment 1
[0024] Example one : Such as figure 1 As shown, a miniaturized high isolation ceramic package structure includes a shell a, a chip b, a metal cover c, and a bonding wire d; the shell a is composed of a ceramic layer a1, a metallization layer a2, and an interconnection blind hole a3 The metallization layer a2 is composed of the bonding finger layer a21, the sealing area a22, the connection area a23, the sticky core area a24 and the printed line layer a25; the center of the shell a is provided with a sticky core for placing the chip b Area a24; the core area a24 is surrounded by a bonding finger layer a21; the bonding finger layer a21 includes a ground bonding finger a211 and a signal bonding finger a212, and the ground bonding finger a211 is connected to a blind hole a3 through an interconnection The printed line layer a25, the sealing area a22 and the sticky core area a24 are connected, and the signal bonding finger a212 is connected to the connection area a23.
[0025] The metal...
Embodiment 2
[0031] Embodiment two: such as Figure 4 As shown, the difference from the first embodiment is that the core-sticking area a24 and the second printed line layer a252 are in the same layer. Compared with the first embodiment, the advantage is that the thickness of the shell a can be reduced, but at the same time the mechanical reliability of the shell a can be reduced. Therefore, this form is mainly used for the occasions where the outer shape of the shell a is small and the thickness of the shell a is relatively high.
Embodiment 3
[0032] Example three: such as Figure 5 As shown, the difference from the first embodiment is that the signal bonding finger a212 is interconnected with the connection area a23 through the interconnection blind hole a3 to achieve electrical connection. Compared with the first embodiment, since there is no semicircular hole on the edge of the tube shell a, the outer shape of the tube shell a can be further reduced under the premise of ensuring the reliability of the tube shell a, and the miniaturization of the package can be realized. However, it is necessary to minimize the influence of the interconnection blind hole a3 on the mechanical properties of the package a, and the punch position needs to be moved inward, which will shorten the wiring length of the bonding finger layer a21 and increase the wiring difficulty. Therefore, this form is mainly used for occasions where isolation is not high and the external size of the shell a is relatively high.
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