Testing method of local contact windowing region in local contact back passivation solar cell

Abstract

The invention discloses a testing method of a local contact windowing region in a local contact back passivation solar cell. The testing method comprises the following steps of: (1) preparing a sample, firstly carrying out cutting operation in the direction at a 90-degree angle to a silicon-aluminum alloy extension direction on the front surface of the solar cell sheet to be tested, then breaking the cell sheet off along the cutting line, and obtaining the sample to be tested, wherein the cutting depth is 50-70 micrometers; and (2) adopting a scanning electron microscope to test the cross section at the cut and broken part of the above sample to be tested, and then testing the size of the local contact windowing region at the cross section. According to the invention, the size of the local contact windowing region at the cross section can be accurately measured, and the influences in the prior art, which are caused by that the sample cracks along a crystal boundary direction in the sample preparing process, are avoided.

Description

technical field [0001] The invention relates to a test method for a local contact window area in a local contact back passivation solar cell, which is mainly used for testing the filling effect and width of the local contact window area and belongs to the technical field of solar cells. Background technique [0002] Conventional fossil fuels are being exhausted day by day. Among the existing sustainable energy sources, solar energy is undoubtedly the cleanest, most common and most potential alternative energy source. Solar power generation devices, also known as solar cells or photovoltaic cells, can directly convert solar energy into electrical energy. The principle of power generation is based on the photovoltaic effect of semiconductor PN junctions. [0003] With the development of science and technology, partial contact back passivation (PERC) solar cells have emerged, which is a newly developed high-efficiency solar cell and has attracted widespread attention in the ind...

AI Technical Summary

Problems solved by technology

This is because: in the prior art, the shape of the laser window area is similar to the side of the cylinder, and when the sample is prepared, the sample is always split along the direction of the grain boundary, so the arc-shaped cut surface cannot be formed, so the sample The cracking angle and the arc-shaped cutting surface are always at a certain angle, the effect is that the test value of the width of the local contact window area is larger than the actual value, and finally the test is inaccurate.

In addition, many cracks and unevenness will appear on the edges of the existing prepared samples

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